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Cu/X(X=Cr, Nb)纳米多层膜力/电学性能的尺度依赖性 |
张金钰,张欣,牛佳佳,刘 刚,张国君, 孙 军 |
西安交通大学金属材料强度国家重点实验室, 西安 710049 |
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LENGTH SCALE DEPENDENT MECHANICAL/ELECTRICAL PROPERTIES OF Cu/X (X=Cr, Nb) NANOSTRUCTURED METALLIC MULTILAYERS |
ZHANG Jinyu, ZHANG Xin, NIU Jiajia, LIU Gang, ZHANG Guojun, SUN Jun |
State Key Laboratory for Mechanical Behavior of Materials, Xi’an Jiaotong University, Xi’an 710049 |
引用本文:
张金钰 张欣 牛佳佳 刘刚 张国君 孙军. Cu/X(X=Cr, Nb)纳米多层膜力/电学性能的尺度依赖性[J]. 金属学报, 2011, 47(10): 1348-1354.
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LENGTH SCALE DEPENDENT MECHANICAL/ELECTRICAL PROPERTIES OF Cu/X (X=Cr, Nb) NANOSTRUCTURED METALLIC MULTILAYERS[J]. Acta Metall Sin, 2011, 47(10): 1348-1354.
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