TEM OBSERVATION OF ION-PLATED Al FILM ON Ni SUBSTRATE
WAN Lijun;CHEN Baoqing;GUO Kexin Dalian Maritime University Dalian Institute of Technology K. H. Kuo Institute of Metal Research; Academia Sinica; Shenyang
Cite this article:
WAN Lijun;CHEN Baoqing;GUO Kexin Dalian Maritime University Dalian Institute of Technology K. H. Kuo Institute of Metal Research; Academia Sinica; Shenyang. TEM OBSERVATION OF ION-PLATED Al FILM ON Ni SUBSTRATE. Acta Metall Sin, 1988, 24(6): 443-446.
Abstract A new phase is found at the interface between Al film and Ni substrate when thetime of ion-plating has come to 5 min. And it is identified to be body centered tetragonal latticewith the constants a=b=0.588 nm, c=0.480 nm. The varieties of the microstractures and phases withthe ion-plating time are observed. Based on these results, the ion-plating film formation mechanismis also discussed.