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| TEM OBSERVATION OF ION-PLATED Al FILM ON Ni SUBSTRATE |
| WAN Lijun;CHEN Baoqing;GUO Kexin Dalian Maritime University Dalian Institute of Technology K. H. Kuo Institute of Metal Research; Academia Sinica; Shenyang |
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Cite this article:
WAN Lijun;CHEN Baoqing;GUO Kexin Dalian Maritime University Dalian Institute of Technology K. H. Kuo Institute of Metal Research; Academia Sinica; Shenyang. TEM OBSERVATION OF ION-PLATED Al FILM ON Ni SUBSTRATE. Acta Metall Sin, 1988, 24(6): 443-446.
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Abstract A new phase is found at the interface between Al film and Ni substrate when thetime of ion-plating has come to 5 min. And it is identified to be body centered tetragonal latticewith the constants a=b=0.588 nm, c=0.480 nm. The varieties of the microstractures and phases withthe ion-plating time are observed. Based on these results, the ion-plating film formation mechanismis also discussed.
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Received: 18 June 1988
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1 Mattox D M, McDonald J E. J Appl Phys, 1963; 34: 2493 2 Mattox D M. Electronchem Technol, 1964; 9: 295 3 山中久彦,纲沢栄二,金属材料;1977;17:85 4 郭可信,叶恒强,吴玉琨.电子衍射图,科学出版社,1983:241 |
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