X--Ray Diffraction Analysis for the Recrystallization Behavior Of SiCw/Al Composite at High Temperature

Acta Metall Sin

2004, Vol. 40

Issue (10): 1023-1026 DOI:

Research Articles

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X--Ray Diffraction Analysis for the Recrystallization Behavior Of SiCw/Al Composite at High Temperature

JIANG Chuanhai; WU Jiansheng;WANG Dezun

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JIANG Chuanhai; WU Jiansheng; WANG Dezun. X--Ray Diffraction Analysis for the Recrystallization Behavior Of SiCw/Al Composite at High Temperature. Acta Metall Sin, 2004, 40(10): 1023-1026 .

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Abstract By using in situ X-ray diffraction and profile analysis, the variations of subgrain size and microstrain in the cold-rolled SiCAl composite at high temperature were measured, and the recrystallization behavior of composite was investigated. Test results show that both of the activation energies of recrystallized grain growth and matrix recovery at higher temperature are close to the activation energy for self-diffusion of pure Al, which verifies that the recovery phenomenon was accompanied with the grain growth, and the whiskers can not affect the grain growth and recovery of matrix in composite at higher temperature.

Key words: SiCwAl/Al composite recrystallization X-ray diffraction

Received: 28 August 2003

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