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THE INTERFACIAL ANALYSIS OF MO/SiO_2 MULTILAYERS MIRROR FOR SOFT X-RAY |
WANG Fengping;WANG Peixuan;FANG Zhengzhi (University of Science and Technology Beting; Beting 100083); CUI Mingqi;JIANG Xiaoming; MA Hong; (Institute of High Energy Physics; Chinese Academy of Sciences; Beijing 100039) |
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Cite this article:
WANG Fengping;WANG Peixuan;FANG Zhengzhi (University of Science and Technology Beting; Beting 100083); CUI Mingqi;JIANG Xiaoming; MA Hong; (Institute of High Energy Physics; Chinese Academy of Sciences; Beijing 100039). THE INTERFACIAL ANALYSIS OF MO/SiO_2 MULTILAYERS MIRROR FOR SOFT X-RAY. Acta Metall Sin, 1997, 33(7): 737-741.
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Abstract Groups of Mo/Sio2 multilayer films were fabricated by magnetron sputter ing in Ar atmosphere. Low angle X-ray diffraction analysis of the multilayers was carried out at the diffusion scattering station of BSRF. The interfacial roughness and periodic structure are investigated through simulation of low angle X-ray diffraction spectra based on the dynamical theory. The periodic structure and composition of Mo/SiO2 multilayers were also characterized with AES. The results show that very good composition modulation struc ture formed, and no obvious diffusion of St and / or O through Mo layers is observed.
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Received: 18 July 1997
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1 Chakrabotry P. Int J Mod Phys, 1991; B 5: 2133 2 Eason R W. TechnicaI Report of Ruther.brd Appleton Laboratory, A4, 1987: 1 3 Okada H, Mayama K, Goto Y, Kusunoki L, Yanagihara M. Appl Opt, 1994; 33: 4219 4 Berning P H. Phys Thin Fdms, 1963, 1. 69 5 Underwood J H, Barbee T W Jr. AIP Conf Proc, 1981, (75): 170 6 Henke B L, Lee P, Tanaka T J, Shimabukuro R L, Fuiikawa B K. A,omic Data and Nuclear Data TabIe, Vol.27, New York' Academic Press, 1982: 1 7 Li Z G, Smith D J, Tsen S-C Y, Boher P, Houdy Ph. J Appl Phys, 1991; 70: 2905 |
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