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超薄铝膜电导特性的原位测量研究 |
唐兆麟;黄荣芳;闻立时 |
中国科学院金属研究所 |
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IN SITU MEASUREMENT OF ELECTRIC CONDUCTIVITY OF ULTRA THIN Al FILM |
TANG Zhaolin; HUANG Rongfang; WEN Lishi(Institute of Metal Research;Chinese Academy of Sciences; Shenyang 110015) (Manuscript received 1995-05-04; in revised form 1995-08- 15) |
引用本文:
唐兆麟;黄荣芳;闻立时. 超薄铝膜电导特性的原位测量研究[J]. 金属学报, 1996, 32(3): 308-312.
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IN SITU MEASUREMENT OF ELECTRIC CONDUCTIVITY OF ULTRA THIN Al FILM[J]. Acta Metall Sin, 1996, 32(3): 308-312.
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