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铜互连多层膜系中自对准CuSiN层的微结构及其热稳定性 |
刘 波 唐文进 宋忠孝 徐可为 |
西安交通大学金属材料及强度国家重点实验室 |
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Microstructure and Thermal Stability of CuSiN Self--Aligned Layerin Advanced Copper Interconnect Multilayer Films |
LIU Bo; TANG Wenjin; SONG Zhongxiao; XU Kewei |
State key Laboratory for Mechanical Behavior of Materials; Xi'an Jiaotong University |
引用本文:
刘波; 唐文进; 宋忠孝; 徐可为 . 铜互连多层膜系中自对准CuSiN层的微结构及其热稳定性[J]. 金属学报, 2007, 43(11): 1145-1147 .
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Microstructure and Thermal Stability of CuSiN Self--Aligned Layerin Advanced Copper Interconnect Multilayer Films[J]. Acta Metall Sin, 2007, 43(11): 1145-1147 .
[1]Maex K,Baklanov M R,Shamiryan D,Lacopi F, Brongersma S H,Yanovitskaya Z S.I Appl Phys,2003; 93:8793 [2]Semiconductor Industry Association.2003 International Technology Roadmap for Semiconductors,TX,USA,In- ternational SEMATECH,2003 [3]Li B Z,Timothy D.Sullivan,Lee T C,Badami D.Micro- electron Reliab,2004;44:365 [4]Plantier L,Le-Friec Y,Humbert A,Imbert G,Sabouret E,Sardo M,Girault V,Delille D,Jullian S,Junker K. Microelectron Eng,2006;83:2407 [5]Wang T C,Cheng Y L,Wang Y L,Hsieh T E,Hwang G J,Chen C F.Thin Solid Films,2006;498:36 [6]Zhang D H,Yang L Y,Li C Y,Lu P W,Foo P D.Thin Solid Films,2006;504:235 [7]Vitiello J,Ducote V,Farcy A,Gosset L G,Le-Friec Y, Hopstaken M,Jullian S,Cordeau M,Ailhas C,Chapelon L L,Barbier D,Veillerot M,Danel A,Torres J.Microelec- tron Eng,2006;83:2130 [8]Chhun S,Gosset L G,Michelon J,Girault V,Vitiello J, Hopstaken M,Courtas S,Debauche C,Bancken P H L, Gaillard N,Bryce G,Juhel M,Pinzelli L,Guillan J,Gras R,Van Schravendijk B,Dupuy J-C,Tortes J.Microelec- tron Eng,2006;83:2094 [9]Gambino J,Wynne J,Gill J,Mongeon S,Meatyard D, Lee B,Bamnolker H,Hall L,Li N,Hernandez M,Little P, Hamed M,Ivanov I,Gan C L.Microelectron Eng,2006; 83:2059 [10]Hu C K,Gignac L,Rosenberg R.Microelectron Reliab, 2006;46:213 [11]Hu C K,Gignac L,Rosenberg R,Liniger E,Rubino J, Sambucetti C,Domenicucci A,Chen X,Stamper A.Appl Phys Lett,2002;81:10 [12]Usami T,Ide T,Kakuhara Y,Ajima Y,Ueno K, Maruyama T,Yu Y,Apen E,Chattopadhyay K,Van Schravendijk B,Oda N,Sekine M.Proc IITC,2006:125 [13]Gosset L G,Chhun S,Guillan J,Gras R,Flake J,Daa- men R,Michelon J,Haumesser P H,Olivier S,Decorps T, Torres J.Proc IITC,2006:84 [14]Lin M H,Lin Y L,Chang K P,Su K C,Wang F H.Mi- croelectron Reliab,2005;45:1061V |
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