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含硅钢下贝氏体中台阶及残余奥氏体层错的透射电镜观察 |
张喜燕;康沫狂;陈大明;武小雷 |
西北工业大学 |
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INTERFACE LEDGE AND RETAINED AUSTENITE FAULTS OF LOWER BAINITE IN SILICON CONTAINING STEELS |
ZHANG Xiyan;KANG Mokuang;CHEN Daming;Xiaolei(Northwestern Polytechnical University;Xi'an)(Manuscript received 30 June;1993;in revised form 6 September;1993) |
引用本文:
张喜燕;康沫狂;陈大明;武小雷. 含硅钢下贝氏体中台阶及残余奥氏体层错的透射电镜观察[J]. 金属学报, 1994, 30(3): 109-111.
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INTERFACE LEDGE AND RETAINED AUSTENITE FAULTS OF LOWER BAINITE IN SILICON CONTAINING STEELS[J]. Acta Metall Sin, 1994, 30(3): 109-111.
1HehemannRF,KinsmanKR,AaronsonHI.MetallTrans,1972;3A:10772徐祖耀,顾文桂,俞学节.金属学报,1983;19:A123金强,方鸿生,曹建军,郑燕康,陈秀云.金属学报,1990;26:A3914孙加林,马世良,康沫狂.西北工业大学学报,1990;增刊:635HuangDH,ThomasG.MetallTrans,1977;8A:16616SandivkBPT.MetallTrans,1982;13A:777 |
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