EVOLUTION OF STRUCTURE AND MAGNETIC PROPERTIES DURING CRYSTALLIZATION OF AMORPHOUS Co/Ti MULTILAYER FILMS

Acta Metall Sin

1996, Vol. 32

Issue (11): 1209-1214 DOI:

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EVOLUTION OF STRUCTURE AND MAGNETIC PROPERTIES DURING CRYSTALLIZATION OF AMORPHOUS Co/Ti MULTILAYER FILMS

WU Ping; JIANG Enyong; LIU Yuguang; WANG Cunda(Tianjin University; Tianjin 300072)

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WU Ping; JIANG Enyong; LIU Yuguang; WANG Cunda(Tianjin University; Tianjin 300072). EVOLUTION OF STRUCTURE AND MAGNETIC PROPERTIES DURING CRYSTALLIZATION OF AMORPHOUS Co/Ti MULTILAYER FILMS. Acta Metall Sin, 1996, 32(11): 1209-1214.

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Abstract The Co / Ti multilayer thin films with an amorphous microstructure are prepared by dual facing target sputtering (DFTS) at room temperature. The evolution of the microstructure and magnetization in Co / Ti multilayer thin film during annealing has been investigated by in situ saturation magnetization measurements and the conventional transmission electron microscopy (TEM). Annealing results showed that crystalline Ti precipitated at 400℃ and Co at 500℃. Increasing temperature resulted in the coarsening of Co precipitates and the simultaneous growth of Ti grains. At temperature of about 600℃, Co phase disappeared and Co2Ti phase formed. The thermal magnetic measurement result also shows two clear magnetic changes at 390 and 520℃ respectively, corresponding to the changes in the microstructure of the film. The Co-Ti magnetic granular films can be obtained by annealing at moderate temperature. Correspondent: WU Ping, Department of Applied Physics, Tianjin University, Tianjin 300072

Key words: Co / Ti multilayer film amorphous crystallization saturation magnetization

Received: 18 November 1996

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https://www.ams.org.cn/EN/ OR https://www.ams.org.cn/EN/Y1996/V32/I11/1209

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