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利用电子衍射照片确定ZrO_2薄膜的织构状态 |
王英华 |
清华大学材料科学与工程系;副教授;北京100084 |
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DETERMINATION OF TEXTURE STATE OF THIN FILM ZrO_2 BY ELECTRON DIFFRACTION PATTERN |
WANG Yinghua;Department of Materials Science and Engineering.Tsinghua University;Beijing 100084 |
引用本文:
王英华. 利用电子衍射照片确定ZrO_2薄膜的织构状态[J]. 金属学报, 1993, 29(6): 95-96.
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DETERMINATION OF TEXTURE STATE OF THIN FILM ZrO_2 BY ELECTRON DIFFRACTION PATTERN[J]. Acta Metall Sin, 1993, 29(6): 95-96.
1 Cullity B D. Elements of X-Ray Diffraction. Reading Mass: Addison-Wesley, 1978 2 王英华.X光衍射技术基础.北京:原子能出版社,1987 |
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