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薄层应变的X射线衍射技术 |
徐景阳;VANBRUSSELB.J.;NOORDHUISJ.;BRONSVELDP.M.;DEHOSSONJ.Th.M. |
中国科学院上海冶金研究所;副研究员;上海(200050);荷兰Groningen大学材料科学中心;荷兰Groningen大学材料科学中心;荷兰Groningen大学材料科学中心;荷兰Groningen大学材料科学中心 |
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X-RAY DIFFRACTION FOR SHOWING STRAIN IN SURFACE LAYER |
XU Jingyang;VAN BRUSSEL B J;NOORDHUIS J;BRONSVELD P M;DE HOSSON J Th M Shanghai Institute of Metallurgy; Academia Sinica; Department of Applied Physics; Materials Science Centre; University of Groningen; Netherlands |
引用本文:
徐景阳;VANBRUSSELB.J.;NOORDHUISJ.;BRONSVELDP.M.;DEHOSSONJ.Th.M.. 薄层应变的X射线衍射技术[J]. 金属学报, 1993, 29(2): 88-91.
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X-RAY DIFFRACTION FOR SHOWING STRAIN IN SURFACE LAYER[J]. Acta Metall Sin, 1993, 29(2): 88-91.
1 徐景阳,谭淞生,许顺生.物理,1988;17:42 2 Xu J Y, Van Brussel B A, Bronsveld P M, De Hosson J. Th. M. Surface and Coatings Technology, 1991; 45: 43 3 De Beurs H, Hovius J. A, De Hosson J. Th. M. Acta Metall, 1988; 36: 3123 4 Xu J Y, Van Brussel B J, Noordhuis J, Bronsveld P M, De Hosson J Th M. Proc Surface Engineering Conf, Toronto, 1990: 167 5 Cullity B D. Ments of Xray Diffraction. New York: Academic, 1977 6 Cohen B G. Solid State Electronics. 1967; 10: 33 7 Johnson E, GrAb K L, Johansen A, Sarholt-Kristensen L, B Rgesen P, Scherzer B M U, Hayashi N, Sakamoto I. Nucl Instrum Methods Phys Res, 1989; B39: 567 |
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