|
|
Au/NiCr/Ta多层金属膜择优取向与残余应力的关系 |
唐武 徐可为 王平 李弦 |
西安交通大学金属材料强度国家重点实验室;西安710049 |
|
引用本文:
唐武; 徐可为; 王平; 李弦 . Au/NiCr/Ta多层金属膜择优取向与残余应力的关系[J]. 金属学报, 2002, 38(9): 932-935 .
[1] Shute C J, Cohen J B. J Mater Res, 1991; 5: 950 [2] Borgesen P, Lee J K, Gleixner R, Li C Y. Appl Phys Lett,1992; 60: 1706 [3] Vinci R P, Marieb T N, Bravman J C. Mater Res SocSymp Proc, 1993; 308: 297 [4] Cullity B D. Elements of X-Ray Diffraction. Reading,Mass: Addison-Wesley, 1978: 456 [5] Xu K W, He J W. Rare Met Mater Eng, 1989; 5: 7 (徐可为,何家文.稀有金属材料与工程,1989;5:7) [6] Bunshah R F. Proc 7th Int Vac Cong and 3rd Int ConfSolid Surface, Vienna, 1977: 1553 [7] Mayadas A F, Shatzkes M. Phys Rev, 1970; B1: 1382 [8] Attardo M J, Rosenberg R. J Appl Phys, 1970; 41: 2381 [9] Vaidya S, Sinha A K. Thin Solid Films, 1981; 75: 253 [10] Xu K W, Gao R S, Chen J. Vac Sci Technol , 1993; 13: 108 (徐可为,高润生,陈 谨.真空科学与技术,1993;13:108) [11] Zhang J M, Xu K W, Ji V. Appl Surf Sci, 2002; to bepublished [12] Ljungcrantz H, Hultman L, Sundgren J E. J Vac Sci Technol, 1993; 11A: 543 [13] Burnett A F, Cech J M. J Vac Sci Technol, 1993; 11A:297 [14] Murarka S P. Mater Sci Eng, 1997; R19: 87 [15] Ray R A, Cuomo J J, Yee D S. J Vac Sci Technol , 1988;6A: 1621 [16] Kim S P, Choi H M, Choi S K. Thin Solid Films, 1998;322: 298 [17] Zhang J M, Xu K W, Ji V. Appl Surf Sci, 2001; 180: 1 [18] Zhang J M, Xu K W, Ji V. J Cryst Growth, 2001; 226:168 [19] Murakami M, Angelillo J, Huang H W, Segmuller A, Kircher C J. Thin Solid Films, 1979; 60: 1, |
|
Viewed |
|
|
|
Full text
|
|
|
|
|
Abstract
|
|
|
|
|
Cited |
|
|
|
|
|
Shared |
|
|
|
|
|
Discussed |
|
|
|
|