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合金元素对中温Sn-Ag-Cu焊料互连组织及剪切强度的影响 |
曹丽华1,陈胤伯1,2,史起源1,远杰1,2,刘志权1,2,3( ) |
1. 中国科学院金属研究所 沈阳 110016 2. 中国科学技术大学材料科学与工程学院 沈阳 110016 3. 中国科学院深圳先进技术研究院 深圳 518055 |
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Effects of Alloy Elements on the Interfacial Microstructure and Shear Strength of Sn-Ag-Cu Solder |
CAO Lihua1,CHEN Yinbo1,2,SHI Qiyuan1,YUAN Jie1,2,LIU Zhiquan1,2,3( ) |
1. Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China 2. School of Materials Science and Engineering, University of Science and Technology of China, Shenyang 110016, China 3. Shenzhen Institutes of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, China |
引用本文:
曹丽华, 陈胤伯, 史起源, 远杰, 刘志权. 合金元素对中温Sn-Ag-Cu焊料互连组织及剪切强度的影响[J]. 金属学报, 2019, 55(12): 1606-1614.
CAO Lihua,
CHEN Yinbo,
SHI Qiyuan,
YUAN Jie,
LIU Zhiquan.
Effects of Alloy Elements on the Interfacial Microstructure and Shear Strength of Sn-Ag-Cu Solder[J]. Acta Metall Sin, 2019, 55(12): 1606-1614.
[1] | Katsuaki S, translated by Liu Z Q, Li M Y. Introduction to Lead-Free Soldering [M]. Beijing: Science Press, 2017: 3 | [1] | (Katsuaki S著,刘志权,李明雨译. 无铅软钎焊技术基础 [M]. 北京: 科学出版社, 2017: 3) | [2] | Zeng K, Tu K N. Six cases of reliability study of Pb-free solder joints in electronic packaging technology [J]. Mater. Sci. Eng., 2002, R38: 55 | [3] | Li P, Han J, Wang Y, et al. Microstructure and intermetallic compounds in Sn-3Ag-3Bi-3In solder joints on Cu matrix [A]. 2017 18th International Conference on Electronic Packaging Technology (ICEPT) [C]. Harbin: IEEE, 2017: 655 | [4] | Ho C E, Yang S C, Kao C R. Interfacial reaction issues for lead-free electronic solders [J]. J. Mater. Sci. Mater. Electron., 2007, 18: 155 | [5] | Ma X, Qian Y Y, Yoshida F. Effect of La on the Cu-Sn intermetallic compound (IMC) growth and solder joint reliability [J]. J. Alloys Compd., 2002, 334: 224 | [6] | Harris P G, Chaggar K S. The role of intermetallic compounds in lead-free soldering [J]. Solder. Surf. Mount Technol., 1998, 10(3): 38 | [7] | Wu C M L, Yu D Q, Law C M T, et al. Properties of lead-free solder alloys with rare earth element additions [J]. Mater. Sci. Eng., 2004, R44: 1 | [8] | Krammer O, Hurtony T, á Hadarits. Investigating intermetallic layer growth in Innolot solder alloy [A]. 2017 40th International Spring Seminar on Electronics Technology [C]. Sofia: IEEE, 2017: 1 | [9] | Chowdhury M R, Ahmed S, Fahim A, et al. Mechanical characterization of doped SAC solder materials at high temperature [A]. 2016 15th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems [C]. Las Vegas: IEEE, 2016: 1202 | [10] | Blair H D, Pan T Y, Nicholson J M. Intermetallic compound growth on Ni, Au/Ni, and Pd/Ni substrates with Sn/Pb, Sn/Ag, and Sn solders [PWBs] [A]. 1998 48th Electronic Components and Technology Conference [C]. Seattle: IEEE, 1998: 259 | [11] | Gyenes A, Benke M, Teglas N, et al. Investigation of multi-component lead-free solders [J]. Arch. Metall. Mater., 2017, 62: 1071 | [12] | Geng J, Zhang H W, Mutuku F, et al. Novel solder alloy with wide service temperature capability for automotive applications [A]. 2017 18th International Conference on Electronic Packaging Technology [C]. Harbin: IEEE, 2017: 1700 | [13] | Ghosh G. Interfacial reaction between multicomponent lead-free solders and Ag, Cu, Ni and Pd substrates [J]. J. Electron. Mater., 2004, 33: 1080 | [14] | Laurila T, Hurtig J, Vuorinen V, et al. Effect of Ag, Fe, Au and Ni on the growth kinetics of Sn-Cu intermetallic compound layers [J]. Microelectron. Reliab., 2009, 49: 242 | [15] | Huang M L, Chen L D, Zhao Y. Effect of Cu-Ni cross-solder interaction on liquid-solid interfacial reaction in Cu/Sn/Ni solder joint [J]. Chin. J. Nonferrous Met., 2012, 23: 1073 | [15] | (黄明亮, 陈雷达, 赵 宇. Cu-Ni交互作用对Cu/Sn/Ni焊点液固界面反应的影响 [J]. 中国有色金属学报, 2012, 23: 1073) | [16] | Roy A K, Chabra R P. Prediction of solute diffusion coefficients in liquid metals [J]. Metall. Trans., 1988, 19A: 273 | [17] | Laurila T, Vuorinen V, Paulasto-Kr?ckel M. Impurity and alloying effects on interfacial reaction layers in Pb-free soldering [J]. Mater. Sci. Eng., 2010, R68: 1 | [18] | Sharma G, Eichfeld C M, Mohney S E. Intermetallic growth between lead-free solders and palladium [J]. J. Electron. Mater., 2003, 32: 1209 | [19] | Hirose A, Fujii T, Imamura T, et al. Influence of interfacial reaction on reliability of QFP joints with Sn-Ag based Pb free solders [J]. Mater. Trans., 2001, 42: 794 | [20] | Cho M G, Kang S K, Seo S K, et al. Effects of under bump metallization and nickel alloying element on the undercooling behavior of Sn-based, Pb-free solders [J]. J. Mater. Res., 2009, 24: 534 | [21] | Huang Y C, Chen S W, Wu K S. Size and substrate effects upon undercooling of Pb-free solders [J]. J. Electron. Mater., 2010, 39: 109 | [22] | Zhou M B, Qin H B, Ma X, et al. Interfacial reaction and melting/solidifications characteristics between Sn and different metallization of Cu, Ag, Ni and Co [A]. Proceedings of the 11th International Conference on Electronic Packaging Technology and High Density Packaging [C]. Xi'an: IEEE, 2010: 202 | [23] | Gao L L, Xue S B, Zhang L, et al. Effect of alloying elements on properties and microstructures of SnAgCu solders [J]. Microelectron. Eng., 2010, 87: 2025 | [24] | Luo F. Effects of Bi, Sb on microstructures and propensity of Sn-Ag-Cu solder alloys [D]. Zhenjiang: Jiangsu University of Science and Technology, 2010 | [24] | (罗 飞. 微量Bi, Sb对Sn-3.5Ag-0.5Cu无铅钎料组织与性能的影响 [D]. 镇江: 江苏科技大学, 2010) | [25] | Liu A A, Kim H K, Tu K N, et al. Spalling of Cu6Sn5 spheroids in the soldering reaction of eutectic SnPb on Cr/Cu/Au thin films [J]. J. Appl. Phys., 1996, 80: 2774 | [26] | Kim H K, Tu K N. Rate of consumption of Cu in soldering accompanied by ripening [J]. Appl. Phys. Lett., 1995, 67: 2002 | [27] | Shnawah D A, Sabri Mohd Faizul M, Badruddin I A, et al. Effect of Ag content and the minor alloying element Fe on the mechanical properties and microstructural stability of Sn-Ag-Cu solder alloy under high-temperature annealing [J]. J. Electron. Mater., 2013, 42: 470 | [28] | Pereira P D, Spinelli J E, Garcia A. Combined effects of Ag content and cooling rate on microstructure and mechanical behavior of Sn-Ag-Cu solders [J]. Mater. Des., 2013, 45: 377 |
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