Acta Metall Sin  1992, Vol. 28 Issue (7): 1-18    DOI:

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FINE STRUCTURE OF BOTH INTERFACES AND INTERFACIAL REACTION PRODUCTS

LI Douxing; PING Dehai; NING Xiaoguang; YE Hengqiang (Laboratory of Atomic Imaging of Solids; Institute of Metal Research; Academia Sinica; Shenyang)

LI Douxing; PING Dehai; NING Xiaoguang; YE Hengqiang (Laboratory of Atomic Imaging of Solids; Institute of Metal Research; Academia Sinica; Shenyang). FINE STRUCTURE OF BOTH INTERFACES AND INTERFACIAL REACTION PRODUCTS. Acta Metall Sin, 1992, 28(7): 1-18.

Abstract References Related Articles Recommended Metrics Download:  PDF(7244KB)  Export:  BibTeX | EndNote (RIS)       Abstract  Recent studies by the authors are reviewed of the fine structure of both the materials interfaces and the interfacial reaction products in semiconductor superlattice, metal multilayer, ceramics and composite materials by means of selected area electron diffraction patterns and high-resolution electron microscopy. Analysis and discussion in details are presented concerning the orientation relationships, the characterization of steps, facets and roughness of interfaces, atomic bonding across interface, the degree of coherency, the structure of misfit dislocation and elastic strain relaxations at interface, the presence of defects at interface, the strure of interfacial reaction products, and the reaction kinetics and mechanism. Key words:  orientation relationship      high-resolution electron microscopy      interface fine structure      interfacial reaction      Received:  18 July 1992      Service E-mail this article Add to citation manager E-mail Alert RSS （） Articles by authors URL:  https://www.ams.org.cn/EN/     OR     https://www.ams.org.cn/EN/Y1992/V28/I7/1 1 Ruhle M, Evans A G, Ashby M F, Hirth J P eds. Metal-Ceramic interface. New York: Pergamon Press, 1990:1-420 2 Schuller I K, Fartash A, Grinsdit M. MRS Bulletin, 1990; October: 33 3 Evans A G, Ruhle M. MRS Bulletin, 1990; October: 46 4 Norton M G, Carter C B. MRS Bulletin, 1990; October: 51 5 Siegel R W. MRS Bulletin, 1990; October: 60 6 Olsen A, Spence J C H. Philos Mag, 1981; A43:945 7 Bourret A, Desseaux J, Renault A. Phil os Mag, 1982; A45:1 8 Florjancic M, Mader W, Ruhle M, Turwitt M. J Phys Colloq, 1985; 46(C4) :129 9 Mayer J, Flynn C P, Ruhle M. Ultramicroscopy, 1990; 33:51 10 Heuer A H, Lanteri V, Chaim R. 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