Multiscale Residual Stress Evaluation of Engineering Materials/Components Based on Neutron and Synchrotron Radiation Technology
LI Shilei1, LI Yang1, WANG Youkang1, WANG Shengjie1, HE Lunhua2, SUN Guang'ai3, XIAO Tiqiao4, WANG Yandong1()
1State Key Laboratory for Advanced Metals and Materials, University of Science and Technology Beijing, Beijing 100083, China 2Spallation Neutron Source Science Center, Dongguan 523803, China 3Institute of Nuclear Physics and Chemistry, China Academy of Engineering Physics, Mianyang 621999, China 4Shanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, China
Cite this article:
LI Shilei, LI Yang, WANG Youkang, WANG Shengjie, HE Lunhua, SUN Guang'ai, XIAO Tiqiao, WANG Yandong. Multiscale Residual Stress Evaluation of Engineering Materials/Components Based on Neutron and Synchrotron Radiation Technology. Acta Metall Sin, 2023, 59(8): 1001-1014.
Multiscale residual stress exists throughout the manufacturing process of engineering components, from design and production to processing and servicing. This stress can impact the machining accuracy, structural load capacity, and fatigue lifespan of these components. Therefore, accurate measurement and regulation of residual stress are critical for ensuring the longevity and reliability of engineering components. However, precise characterization of residual stress is challenging owing to its multilevel and cross-scale distribution traits and dynamic evolution under various conditions, such as temperature and load. Compared with laboratory X-ray measurement methods, neutron diffraction (ND), synchrotron-based high-energy X-ray diffraction (HE-XRD), and synchrotron-based X-ray microbeam diffraction (μ-XRD) techniques offer increased penetration depth and better time and spatial resolutions. In addition, the ability to attach environmental devices enables nondestructive and accurate in situ characterization of three types of residual stresses: macroscopic residual stress, intergranular or interphase microscopic stress, and intragranular ultramicroscopic stress. ND is currently the only nondestructive method capable of accurately measuring three-dimensional (3D) stress at centimeter-level depths within engineering components. HE-XRD, due to its high flux, excellent collimation, and millimeter-level penetration depth for metals, can be utilized for in situ studies of intergranular and interphase stress evolution and partitioning during deformation. The μ-XRD employs a submicron focused beam and differential aperture technology to analyze depth information of a sample. By conducting point-by-point scanning, it can capture 3D distribution of microscopic stress inside a single grain. Furthermore, our group has developed a novel method and device for depth stress characterization based on differential aperture technology under synchrotron-based high-energy monochromatic X-ray transmission geometry, and can measure stress gradients with high precision from the surface to the interior of engineering materials at millimeter-level depths. This study presents the measurement principles, application ranges, and applications of the above-mentioned multiscale stress characterization technologies based on the neutron/synchrotron facilities as well as envisaging the future development of related technologies.
Fund: National Key Research and Development Program of China(2021YFA1600600);National Natural Science Foundation of China(U2141206);National Natural Science Foundation of China(52171098);National Natural Science Foundation of China(51921001)
Corresponding Authors:
WANG Yandong, professor, Tel:(010)82377942, E-mail: ydwang@ustb.edu.cn
Fig.1 The scale of three types of residual stress (a) and the resulting change in diffraction peaks (b) (σ I, σ II, and σ III represent macroscopic residual stress (type I), intergranular microstress (type II), and intragranular ultra microstress (type III), respectively; subscripts α and β indicate α phase and β phase, respectively)
Fig.2 The spatial resolution and penetration depth of neutron diffraction (ND), synchrotron-based high-energy X-ray diffraction (HE-XRD), and synchrotron-based X-ray microbeam diffraction (μ-XRD) techniques on the characterization of multiscale stress
Fig.3 The Residual Stress Neutron Diffractometer (RSND) at China Mianyang Research Reactor (CMRR) (a) and the stress measurement system of the General Purpose Powder Diffractometer (GPPD) at China Spallation Neutron Source (CSNS) (K-B mirror—Kirkpatric-Baez focusing mirror) (b)
Fig.4 The residual stress distributions along hoop (a, c) and radial (b, d) directions of turbine disk by neutron diffraction measurement (a, b) and finite element simulation (c, d)[49](The insert illustrations in Figs.4b and c represent the measuring positions. δ denotes the measurement depth from surface)
Fig.5 Schematic of in situ tensile measurement by HE-XRD technique (dhkl —lattice spacing of a selected plane (hkl), θhkl —Bragg angle, λ—corresponding wavelength, n—diffraction order, φ—azimuthal angle, LD—loading direction, TD—transverse direction) (a) and the lattice strain evolution and strain partition behaviors of γ and α phases in the unaged (b1) and thermal aged (b2) duplex stainless steels with macroscopic strain during deformation[53]
Fig.6 Schematic of the residual stress gradient measurement by HE-XRD (a), the acquisition of stress-free lattice spacing(d 0, indicated by red arrows) of (0002) crystal plane for the shot-peened zirconium alloy (b), and the distribution of residual stress along the depth direction in the shot-peened zirconium alloy (c)
Fig.7 The schematic (a) and photo (b) of the synchrotron radiation "imaging + diffraction" combined system, the line scan position and crack tip position (spot size 100 μm × 100 μm, step 50 μm) (c), and the stress (d) and full width of half maximum (FWHM) (e) distributions near the crack tip along lines 1-3 in Fig.7c
Fig.8 Schematic of differential aperture X-ray diffraction microscopy (DAXM) for in situ characterization of three-dimensional microstress (a) and the characterizations of micro-orientation gradient and lattice strain gradient related to fatigue damage in AL6XN stainless steel by DAXM (DD—direct direction; qFWHM denotes the full width of half miximum, the diffracted intensity as a function of diffraction vector q ) (b1-b3)[57] (b1) schematic of a tensile specimen cut from a fatigued sample of stainless steel, a crystal orientation map slicing along the X-ray beam direction and a map of the (480) diffraction peak FWHM of the same [001] grain (b2) maps of lattice orientation showing grain subdivision (b3) lattice strain distributions in the [001]//LD grain after applying a tensile strain of 0.5%
Fig.9 The schematic (I(m) and I(m + 1) are the diffracted intensities of the step m and (m + 1) with Pt wire translation, respectively) (a), device photo (b), and simulation results (c1-c4) of the deep region stress gradient characterization based on differential aperture technology using transmission geometry (c1) two-dimensional diffraction pattern before depth analysis (c2) the one-dimensional diffraction spectrum (c3) diffraction peaks at different depths (711) after depth analysis (c4) contrast between deep analytical elastic strain gradient and preset values
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