EFFECT OF ORIGINAL GRAIN SIZE ON THE BOUNDARY NETWORK IN ALLOY 690 TREATED BY GRAIN BOUNDARY ENGINEERING
LIU Tingguang, XIA Shuang, LI Hui, ZHOU Bangxin, CHEN Wenjue
Institute of Materials, Shanghai University, Shanghai 200072
Cite this article:
LIU Tingguang XIA Shuang LI Hui ZHOU Bangxin CHEN Wenjue. EFFECT OF ORIGINAL GRAIN SIZE ON THE BOUNDARY NETWORK IN ALLOY 690 TREATED BY GRAIN BOUNDARY ENGINEERING. Acta Metall Sin, 2011, 47(7): 859-864.
Abstract Effect of original grain size on the grain boundary character distribution (GBCD) in alloy 690 after treatment by grain boundary engineering (GBE) was studied using electron backscatter diffraction (EBSD) and orientation image microscopy (OIM). The proportion of low-ΣCSL grain boundary and grain boundary network after GBE are obviously influenced by the original grain size. Optimized GBE grain boundary network after the same annealing process can be obtained by altering the cold work degree based on the original grain size. Thus the microstructure after GBE is influenced by the combined effect of original grain size and deformation amount before annealing. Mean strain of grain is used to express the combined effect. A proper value of mean strain of grain is necessary to achieve the desired GBE grain boundary network.
Supported by National Natural Science Foundation of China (No.50974148), National Basic Research Program of China (No.2011CB610502) and Shanghai Leading Academic Discipline Project (No.S30107)
[20] Xia S, Li H, Liu T G, Zhou B X. J Nucl Mater, doi: 10.1016/j.jnucmat.2011.06.017
[21] Xia S, Li H, Hu C L, Liu T G, Zhou B X, Chen W J. Fontevraud 7: Int Symp Contribution of Materials Investigations to Improve the Safety and Performance of LWRs, Avignon, France: 2010: A025 T06 (CD–ROM)
[22] Palumbo G, Aust K T. Acta Metall, 1990; 38: 2343
[23] Xia S, Zhou B X, Chen W J. Metall Mater Trans, 2009; 40: 3016
[24] Xia S, Zhou B X, Chen W J. J Mater Sci, 2008; 43: 2990
[25] Xia S, Zhou B X, Chen W J, Luo X, Li H. Mater Sci Forum, 2010; 638–642: 2870
[26] Hu C L, Xia S, Li H, Liu T G, Zhou B X, Chen WJ, Wang N. Corros Sci, 2011; 53: 1880
[27] Humphreys F J, Bate P S, Hurley P J. J Microsc, 2001; 201: 50
[28] Yang P. Electron Backscattering Diffraction Technique and its Application. Beijing: Metallurgical Industry Press, 2007: 73
(杨平. 电子背散射衍射技术及其应用. 北京: 冶金工业出版社, 2007: 73)
[29] Berger A, Wilbrandt P J, Ernst F, Klement U, Haasen P. Prog Mater Sci, 1988; 32: 1
[30] Gertsman V Y, Henager C H. Interface Sci, 2003; 11: 403
[31] Doherty R D, Hughes D A, Humphreys F J, Jona J J, Juul J D, Kassner M E, King W E, McNelley T R, McQueen H J, Rollett A D. Mater Sci Eng, 1997; A238: 219