|
|
Cu-Zr-Ti-Ni-Mo 块体非晶合金的腐蚀行为及耐蚀机理研究 |
刘兵;柳林;陈振宇 |
华中科技大学材料学院博03级 |
|
Corrosion Behavior and Anticorrosion Mechanism of Cu-Zr-Ti-Ni-Mo Bulk Metallic Glass |
Liu Bing;; |
华中科技大学材料学院博03级 |
引用本文:
刘兵; 柳林; 陈振宇 . Cu-Zr-Ti-Ni-Mo 块体非晶合金的腐蚀行为及耐蚀机理研究[J]. 金属学报, 2007, 42(1): 82-86 .
,
,
.
Corrosion Behavior and Anticorrosion Mechanism of Cu-Zr-Ti-Ni-Mo Bulk Metallic Glass[J]. Acta Metall Sin, 2007, 42(1): 82-86 .
[1] Lin X H,Johnson W L.J Appl Phys,1995;78:6514 [2] Yim H C,Busch R,Johnson W L.J Appl Phys,1998;83: 7993 [3] Glade S C,Loffler J F,Bossuyt S,Johnson W L.J Appl Phys,2001;89:1573 [4] Inoue A,Zhang W,Zhang T,Kurosaka K.Acta Mater, 2001; 49:2645 [5] Inoue A,Zhang W,Zhang T,Kurosaka K.J Non—Cryst Solids,2002;304:200 [6] Zhang T,Yamamoto T,Inoue A.Mater Trans,2002;43: 3222 [7] Inoue A,Zhang T,Kurosaka K,Zhang W.Mater Trans, 2001;42:1800 [8] Zhang W,Inoue A.Mater Trans,2004;45:1210 [9] Li C F,Saida J,Matsushida M,Inoue A.Scr Mater,2000; 42:923 [10] Zhang Q S,Zhang H F,Deng Y F,Ding B Z,Hu Z Q.Scr Mater,2003;49:273 [11] Yamamoto T,Qin C L,Zhang T,AsamiK,Inoue A.Mater Trans, 2003; 44:1147 [12] Asami K, Teramoto K.Corros Sci, 1979;18:151 [13] Hashimoto K,Asami K,Teramoto K. Corros Sci,1979; 19:3 [14] Qin C L,Asami K,Zhang T,Zhang W,Inoue A.Mater Trans, 2003; 44:1042 [15] Asami K,Qin C L,Zhang T,Inoue A. Mater Sci Eng, 2004;A375—377:235 [16] Asami K,Qin C L,Zhang T,Inoue A.Mater Sci Eng, 2004;A375-377:759 [17] Liu B,Liu L,Sun M,Qiu C L,Chen Q.Acta Metall Sin, 2005;4l:738 (刘兵,柳林,孙民,邱春雷,谌祺.金属学报,2005; 41:738) [18] Liu B, Liu L. Mater Sci Eng, 2006;A415:286 [19] Liu L, Liu B. Electrochim Acta, 2006; 51:3724 [20] MacDonald J R.Impedance Spectroscopy Emphasizing Solid Materials and Systems.New York:Wiley, 1987 [21] Urquidi-Macdonald M, Macdonald D D.J Electrochem Soc, 1987;134:41 [22] Graham M J.Corros Sci, 1995; 37:1337 [23] Wegrelius L., Falkenberg F, Olefjord L J Electrochem Soc, 1999;146:1397 [24] Goetz R,Landolt D.Electrochim Acta,1984; 29:667 [25] Olefjord I, Brox B, Jelvestam U.J Electrochem Soc, 1985; 132:2854 [26] Fromhold A T J, Cook E L. J Appl Phys, 1967;38:1546 [27] Betova I,Bojinov M,Englund A,Fabricius G,Laitinen T, Makela K,Saario T,Sundholm G.Electrochim Aeta, 2001; 46:3627 [28] Habazaki H,Uozumi M,Konno H,Shimizu K,Nagata S, Asami K, Matsumoto K,Takayama K,Oda Y, Skeldon P, Thompson G E.Electrochim Acta, 2003; 48:3257 [29] Metikos-Hukovic M, Babic R, Paic L J Appl Electrochem. 2000; 30:617 |
|
Viewed |
|
|
|
Full text
|
|
|
|
|
Abstract
|
|
|
|
|
Cited |
|
|
|
|
|
Shared |
|
|
|
|
|
Discussed |
|
|
|
|