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| INSIGHT FOR MICROSTRUCTURE RESEARCH OF MATERIALS |
| ZHU Jing1), YE Hengqiang2) |
1) Beijing National Center for Electron Microscopy, Department of Material Science and Engineering, Tsing Hua University, Beijing 100084
2) Shenyang National Lab for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016 |
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Cite this article:
ZHU Jing YE Hengqiang. INSIGHT FOR MICROSTRUCTURE RESEARCH OF MATERIALS. Acta Metall Sin, 2010, 46(11): 1428-1442.
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Abstract In matter science to observe the structure and to understand it's correlation with property in atomic scale is among the aims. Nano-science and technology, microminiaturization of IT devices, higher precision in advanced manufacture $etc$. play an important role to promote microscopic characterization to go deeply to atomic and even electronic level. Based upon the break-through of the aberration corrector the three functions of morphology observation, crystal structure determination and element analysis, provided by transmission electron microscope in recent years have expected to reach atomic resolution standard. Here we introduce the capabilities and prospects for microstructure characterization of materials with these new electron microscopes: (1) aberration-corrected electron microscopy (improving resolution; reducing delocalization effect; negative spherical aberration imaging; defocus-series processing images); (2) a high-resolution probe for imaging and spectroscopy; (3) three-dimensional atomic imaging; (4) interfaces in the complicated structure; (5) time resolution electron microscopy; (6) electron holography; (7) in situ electron microscopy with larger gap in pole piece.
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Received: 19 September 2010
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