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Acta Metall Sin  2008, Vol. 44 Issue (1): 74-78     DOI:
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Study on the micro structure and residual stress of nanocrystalline diamond film
;Dunwen Zuo;Wenzhuang Lu;Min Wang
南京航空航天大学
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Dunwen Zuo; Wenzhuang Lu; Min Wang. Study on the micro structure and residual stress of nanocrystalline diamond film. Acta Metall Sin, 2008, 44(1): 74-78 .

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Abstract  Nanocrystalline diamond film is obtained at the grid and substrate bias current in the self-made double bias HFCVD system. The micro structure of the film is analyzed by Raman, SEM and AFM, and elastic modulus and residual stress are investigated by nano-indentation and XRD method. The results show that the increasing of grid and substrate bias current will cause the decreasing of grain size and the increasing of sp2 non-diamond content in the film. The grid and substrate bias current lead to the decreasing of elastic modulus and thermal stress in the diamond film. The non-diamond impurity induces the compression intrinsic stress in the film. The grid bias current results in the increasing of intrinsic stress as the increasing of grain boundary. But the substrate bias current leads to the weak ability of resistance to deformation as a lot of non-diamond content in the grain boundary, which results in the decreasing of intrinsic stress.
Key words:  HFCVD      Nanocrystalline diamond film      Elastic modulus      Residual stress      Grid bias      Substrate bias      
Received:  18 April 2007     
ZTFLH:  TQ161.8  

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https://www.ams.org.cn/EN/     OR     https://www.ams.org.cn/EN/Y2008/V44/I1/74

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