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Room-temperature deposition of amorphous titanium dioxide film by pulsed bias arc ion plating |
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大连理工大学三束材料改性国家重点实验室 |
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Cite this article:
. Room-temperature deposition of amorphous titanium dioxide film by pulsed bias arc ion plating. Acta Metall Sin, 2007, 43(5): 509-514 .
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Abstract Uniform and transparent amorphous titanium dioxide films were prepared on glass by pulsed bias arc ion plating at room temperature. The influence of pulsed bias on the film optical property was investigated by varying the bias from 0V to 900V. The results show the as-deposited films are amorphous. The bias greatly affects film optical property. The deposition rate first increase and then decrease with increasing the bias, and the peak appears at 100V. As the bias increases, the film absorption edge shifts to the red side first, and then to the blue. While the band gap almost keeps constant, about 3.27eV. The film deposited at 300V reaches atomic smoothness, and RRMS is 0.113nm, which results in the highest refractive index, and nλ=550 is 2.51, more or equal to the maximum value reported ever.
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Received: 07 September 2006
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[1] Qu X X. Film Physics. Beijing: Publishing House of Electronics Industry, 1994: 237 (曲新喜.薄膜物理.北京:电子工业出版社, 1994:237) [2] Demaray R E, Zhang H M, Narasimhan M, Milonopoulou V. US Pat, 20040259305 A1, 2004 [3] Liu J X, Yang D Z, Shi F. Thin Solid Films, 2003; 429: 225 [4] Zhao K, Zhu F, Wang L F, Meng T J, Zhang B C, Zhao K. Acta Phys Sin, 2001; 50: 1390 (赵坤,朱凤,王莉芳,孟铁军,张保澄,赵夔.物理学报,2001;50:1390) [5] Suda Y, Kawasaki H, Ueda T, Ohshima T. Thin Solid Films, 2005; 475: 337 [6] Zhang F, Zheng Z H, Liu X H. Chin J Mater Res, 1992; 13: 581 (张峰,郑志宏,柳襄怀.材料研究学报, 1992;13:581) [7] Zhao Z W, Tay B K, Lau S P, Yu G Q. J Cryst Growth, 2004; 268: 543 [8] Shi J R, Lau S P, Sun Z, Shi X, Tay B K, Tan H S. Surf Coat Technol, 2001; 138: 250 [9] Bendavid A, Martin P J, Takikawa H. Thin Solid Films, 2000; 360: 241 [10] Yan P X, Li X C, Li C, Li X, Xu J W. Chin J Nonferrous Met, 2005; 15: 987 (阎鹏勋,李晓春,李春,李鑫,徐建伟.中国有色金属学报,2005;15:987) [11] Takikawa H, Matsui T, Sakakibara T, Bendavid A, Martin P J. Thin Solid Films, 1999; 348: 145 [12] Lin G Q, Zhao Y H, Guo H M, Wang D Z, Dong C. J Vac Sci Technol, 2004; 22A: 1218 [13] Huang M D, Lee Y P, Dong C, Lin G Q, Sun C, Wen L S. J Vac Sci Technol, 2004; 22A: 250 [14] Theiss W. In: Theiss M, ed., Scout Thin Film Analysis Software Handbook, Aachen, Germany: Hard-and Software, 2005: 189 [15] Okimura K. Surf Coat Technol, 2001; 135: 286 [16] Vyskocil J, Musil J. J Vac Sci Technol, 1992; 10A: 1740 [17] Yamada Y, Uyama H, Murata R, Nozoye H. J Vac Sci Technol, 2001; 19A: 2479 [18] Nakamura M, Kato S, Aoki T, Sirghi L, Hatanaka Y. Thin Solid Films, 2001; 401: 138 [19] Suhail M H, Mohan Rao G, Mohan S. J Appl Phys, 1992; 71: 1421 [20] Amor S B, Rao G M, Mohan S. Thin Solid Films, 1997; 293: 163 [21] Zhang Y, Jiang Z, Yu Z. J Opt Soc Am, 1988; A5: 1601 [22] Meng L, Andritschky M, dos Santos M P. Thin Solid Films, 1993; 223: 242 [23] Tauc J. Phys Solid State, 1966; 15: 627 |
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