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A METHOD FOR CORRECTING INTENSITY IN CONTINUOUS SCANNING X-RAY STRESS MEASUREMENT |
LI Jiabao;KANG Zengqiao;HE Jiawen National Laboratory for Fatigue and Fracture of Materials; Institute of Metal Research; Academia Sinica; Shenyang; Xi'an Jiaotong University Correspondent; associate professor; Institute of Metal Research; Academia Sinica; Shenyang 110015 |
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Cite this article:
LI Jiabao;KANG Zengqiao;HE Jiawen National Laboratory for Fatigue and Fracture of Materials; Institute of Metal Research; Academia Sinica; Shenyang; Xi'an Jiaotong University Correspondent; associate professor; Institute of Metal Research; Academia Sinica; Shenyang 110015. A METHOD FOR CORRECTING INTENSITY IN CONTINUOUS SCANNING X-RAY STRESS MEASUREMENT. Acta Metall Sin, 1992, 28(5): 79-84.
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Abstract A set of absorption curves was priorly prepared on transparent films to fit thebackground and peak intensities in continuous scanning X-ray stress measurement. It may bebetter to correct both background and absorption of pure diffraction intensity. Experimentalresults revealed this to be a reliable correction method.
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Received: 18 May 1992
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1 Li J B, Sun Y J, He J W. Chin J Met Sci Technol, 1988; 4 (3) : 160 2 Short M A, Kelly C J. Adv X-ray Anal, 1973; 16: 37 |
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