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Acta Metall Sin  1998, Vol. 34 Issue (7): 779-784    DOI:
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STUDY ON THE INTERMCIAL MORPHOLOGY AND STRUCTURE OF DIAMOND THIN FILM-CEMENTED CARBIDE SUBSTRATE
KUANG Tongchun; LIU Zhengyi(Department of Mechanical and Electric Engineering; South China University of Technology; Guangzhou 510641)DAI Mingjiang; ZHOU Kesong; WANG Dezheng(Guangzhou Research Institute of Non-Ferrous Metals; Guangzhou 510651)
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KUANG Tongchun; LIU Zhengyi(Department of Mechanical and Electric Engineering; South China University of Technology; Guangzhou 510641)DAI Mingjiang; ZHOU Kesong; WANG Dezheng(Guangzhou Research Institute of Non-Ferrous Metals; Guangzhou 510651). STUDY ON THE INTERMCIAL MORPHOLOGY AND STRUCTURE OF DIAMOND THIN FILM-CEMENTED CARBIDE SUBSTRATE. Acta Metall Sin, 1998, 34(7): 779-784.

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Abstract  The cross-sectional morphologies and microstructures of CVD diamond thin films synthesized onto the cobalt cemented tungsten carbide (YGS) substrate have been observed by means of SEM and TEM. The results show that after chemically cobalt-removed and plasma-etching decarbonized treatments the sequence of cross-sectional structure is as follows:diamond thin film, graphite carbon thin film, small WC grains layer; retained decarbonized layer (W and η phases), residual porous layer, YG8 cemented carbide substrate. Methane concentrations have obvious influences on the formation and thickness of above-mentioned layers.
Key words:  CVD diamond thin film      cemented carbide      interface      cross-sectional morphology     
Received:  18 July 1998     
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