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Acta Metall Sin  1998, Vol. 34 Issue (6): 667-672    DOI:
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THE EFFECT OF PREFERRED ORIENTATION ON X-RAY STRESS MEASUREMENT
YU Ligen(State Key Lab. for Powder Metallurgy; Central South University of Technology; Chungsha 410083)HE Jiawen; B. C.Hendrix(State Key Lab. for Mechanical Behavior of Materials; Xi'an Jiaotong University; Xi'an 710049)Correspondent: YU Ligen; Tel: (0731)8826911-3630; Fad: (0731)8825755
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YU Ligen(State Key Lab. for Powder Metallurgy; Central South University of Technology; Chungsha 410083)HE Jiawen; B. C.Hendrix(State Key Lab. for Mechanical Behavior of Materials; Xi'an Jiaotong University; Xi'an 710049)Correspondent: YU Ligen; Tel: (0731)8826911-3630; Fad: (0731)8825755. THE EFFECT OF PREFERRED ORIENTATION ON X-RAY STRESS MEASUREMENT. Acta Metall Sin, 1998, 34(6): 667-672.

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Abstract  Based on the boundary conditions for prefer--oriellted polycrystals under loading,a new model for the calculation of X--ray elastic constallts (XEC) for prefer--oriented materials,the weighted Hill model, is proposed. The model is applied to calculate the X--my stress measurement curves of some model materials. In order to check the model, the stresses in electroplated and brush--plated copper films are measured. The experimelltal results have good comparison with the calculated results. This helps to explain the low op angle curVature of the stress measuremellt curve for plasma enhanced chemical vapor deposition (PCVD) TiN films. It is mainly caused by the columnar structure exsisted in the PCVD TiN films. When the stress measurement curve has a linear zone at the high op angle, it is suggested to use the slope of the linear zone for the stress calculation.
Key words:  preferred orientation      thin film      X--ray elastic constant(XEC)      weighted Hill model      X--ray stress measurement     
Received:  18 June 1998     
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