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| A SOLUTION OF MINIMUM NORM FOR QUANTITATIVE PHASE ANALYSIS BY STANDARDLESS X-RAY DIFFRACTION |
| ZHAO Han;GONG Yansheng;SHEN Jingyuan;RUAN Qikuan;JIN Jialing;ZHU Hanyu Research Institute of Qiqihar Steel Works |
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Cite this article:
ZHAO Han;GONG Yansheng;SHEN Jingyuan;RUAN Qikuan;JIN Jialing;ZHU Hanyu Research Institute of Qiqihar Steel Works. A SOLUTION OF MINIMUM NORM FOR QUANTITATIVE PHASE ANALYSIS BY STANDARDLESS X-RAY DIFFRACTION. Acta Metall Sin, 1990, 26(6): 151-155.
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Abstract A new expression of quantitathe phase analysis by standardless X-raydiffraction has been derived using intensity matrix of vector modulus. The criterionof standardless X-ray diffraction analysis was suggested, so as to separate the diffra-ction pettern of every phase from that of sample. The optimal solution could beobtained by the least squares regression.
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Received: 18 June 1990
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