ON CHARACTERIZATION OF MICROSTRESS MEASURED BY X-RM DIFFRACTION

Acta Metall Sin

1998, Vol. 34

Issue (12): 1273-1278 DOI:

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ON CHARACTERIZATION OF MICROSTRESS MEASURED BY X-RM DIFFRACTION

ZHANG Dingquan(Shaoxing College of Arts and Sciences; Shaoxing 312000)HE Jiawen(State Key Laboratory for Mechanical Behavior of Materials; Xi'an Jiaotong University; Xi'an 710049)Correspondent:ZHANG Dingquan; associate professor;Tel: (O575)8067050-2812; Fax. (0575)8067917;E-mail: ZX9915@163.NetManuscript received 1998-02-09; in revised form 1998-07-10

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Abstract Microstress measured by X-ray diffraction method is usually characterized bypeak profile. When the classification of internal stress is based on the model suggested by Macherauch, the second kind of internal stress in the crystalline should be associated with the statisticdeviation of strains in various grains with respect to macro-strain.The value of macro-strainleads to the evaluation of the first kind of internal stress. However, in some cases micro-strainalso results in the peak shift of X-ray diffraction profile. Therefore, besides of peak broadening,one should keep an eye on the effect of dricro-strain on peak shift when microstress is evaluated.The peak shift part stands for the average value and the peak broadening stands for its deviation.

Key words: internal stress microstress pseudo-macrostress X-ray method

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https://www.ams.org.cn/EN/ OR https://www.ams.org.cn/EN/Y1998/V34/I12/1273

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