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晶体表面宏观迹线分析方法及其应用 |
李蓬 李玉清 |
Department of Materials Science and Engineering; University of Virginia; Charlottesville; VA 22903; USA |
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引用本文:
李蓬; 李玉清 . 晶体表面宏观迹线分析方法及其应用[J]. 金属学报, 2000, 36(2): 212-216 .
[1] Hirsch P B, Howie A, Nicholson R B, Pashley D W, WhelanM J. Electron Microscopy of Thin Crystals. London: But-terworths, 1965: 311 [2] Huang X Y. Transmission Electron Microscopy. Shanghai:Press of Shanghai Scientific Technology, 1987: 264(黄孝瑛.透射电子显微学.上海:上海科技出版社,1987:264) [3] Li Y Q.Acta Metall Sin, 1993; A28: 359(李玉清.金属学报,1993.A28:359) [4] Li Y Q, Li P, Liu Y J. Paog Nat Sci, 1998; 8: 611(李玉清,李 蓬,刘雅晶.自然科学进展,1998;8:611) [5] Inui H, Matsumuro M, Wu D H, Yamaguchi M. Philos Mag,1997; A75: 395 [6] Li P. The Degree of Master Dissertation, Beijing Universityof Aeronautics and Astronautics, 1998(李 莲.北京航空航天大学硕士学位论文,1998)N |
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