金属学报  1984, Vol. 20 Issue (1): 105-110

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一种测定衍射线位的新方法

张立新;李黎光

中国科学院金属研究所;中国科学院金属研究所

A NEW METHOD FOR DETERMINATION OF DIFFRACTION LINE POSITION

ZHANG Lixin; LI Liguang (Institute of Metal Research; Academia Sinica; Shenyang)(Manuscript received 29 December; 1982; revised manuscript 25 April; 1983)

张立新;李黎光. 一种测定衍射线位的新方法[J]. 金属学报, 1984, 20(1): 105-110.
, . A NEW METHOD FOR DETERMINATION OF DIFFRACTION LINE POSITION[J]. Acta Metall Sin, 1984, 20(1): 105-110.

摘要 参考文献 相关文章 Metrics 全文: PDF(417 KB)   摘要: 本文提出一种与线形变化无关的测定衍射线线位的新方法。测位精度可达△θ±0.01°。可用于在衍射线形对称增宽的条件下,精确测定点阵常数。 Abstract：A new method for the determination of the diffraction line position was developed without relation to the diffraction profile. The precision in determination may approach to △θ±0.01°. It seems to be applicable to the precise determination of the lattice constants under the condition of broadening diffraction profile symmetrically. 收稿日期: 1984-01-18      服务 把本文推荐给朋友 加入引用管理器 E-mail Alert RSS 作者相关文章 张立新 李黎光 44.8K 链接本文: https://www.ams.org.cn/CN/      或      https://www.ams.org.cn/CN/Y1984/V20/I1/105 1 Klug, H.P.; Alexander, L.E., X-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials, 2nd ed., Wiley, New York, 1974, p. 566． 2 Cheary R.W., J. Appl. Cryst., 15 (1982) , 5． No related articles found! Viewed Full text Abstract Cited   Shared      Discussed