金属学报  1984, Vol. 20 Issue (1): 94-104

论文 本期目录 | 过刊浏览 |

“单颗”微量物质的X射线相分析(二)

吴奇星

大冶钢厂钢铁研究所

"SINGLE GRAIN" OSCILLATING CRYSTAL METHOD FOR ULTRAMICROANALYSIS BY X-RAY(Ⅱ)

WU Qixing(Research Institute of Daye Steet Works)(Manuscript received 7 March; 1983; revised manuscript 30 June; 1983)

吴奇星. “单颗”微量物质的X射线相分析(二)[J]. 金属学报, 1984, 20(1): 94-104.
. "SINGLE GRAIN" OSCILLATING CRYSTAL METHOD FOR ULTRAMICROANALYSIS BY X-RAY(Ⅱ)[J]. Acta Metall Sin, 1984, 20(1): 94-104.

摘要 参考文献 相关文章 Metrics 全文: PDF(913 KB)   摘要: 本文提出三种方法,以解决单颗回摆照片上衍射斑点太少或“多余”时的物相鉴定问题,使单颗超微量物质的物相鉴定更加准确可靠。这三种方法是: 1.通过找出试样各晶面的方位与晶面指数之间的变换矩阵来鉴定物相。 2.通过测量底片上各衍射斑点所代表的各个晶面之间的夹角来鉴定物相。 3.通过数底片上各衍射环处所出现的衍射斑点数目来协助物相鉴定。 Abstract：Three methods for the use of "single grain" oscillating crystal identification when the spots on the film were lacking or "residue" have been suggested, It makes the identification for superfine grains more exact and more accurate by finding out the matrix equation about the orientations in space and indices of crystallographic planes; by measuring the angles between the planes that can be represented by the spots on the film; and by taking down the number of the spots which belong to the same d value, in order to find out whether the "single grain" consists of a few crystals or of a multiphase substance. Attempts have also been made to revealing the presence of α-SiO_2 by these methods as well as to further verifying the proposed formulae and figures. 收稿日期: 1984-01-18      服务 把本文推荐给朋友 加入引用管理器 E-mail Alert RSS 作者相关文章 吴奇星 44.8K 链接本文: https://www.ams.org.cn/CN/      或      https://www.ams.org.cn/CN/Y1984/V20/I1/94 1 吴奇星;覃道湘,金属学报,15(1979) ,274． 2 褚幼义;赵琳等编,钢中稀土夹杂物鉴定,冶金工业出版社,即将出版. 3 许顺生;金属X射线学,上海科技出版社,1962年,p.227,233． 4 Klug, H.P.; Alexander, L.E., X-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials, 2nd ed., Wiley, New York, 1974, p. 163． No related articles found! Viewed Full text Abstract Cited   Shared      Discussed