超高压电子显微镜在金属材料性能研究中的应用

金属学报

1981, Vol. 17

Issue (3): 307-351

论文

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超高压电子显微镜在金属材料性能研究中的应用

田岡忠美;邹本三

日本职业训练大学基础学科

RECENT PROGRESS IN HVEM AND ITS APPLI-CATIONS TO THE STUDY OF PROPERTIES OF METALLIC MATERIALS

Taoka Tadami (Institute of Vocational Training; Sagamihara; Kanagawa; Japan)

引用本文:

田岡忠美;邹本三. 超高压电子显微镜在金属材料性能研究中的应用[J]. 金属学报, 1981, 17(3): 307-351.
, . RECENT PROGRESS IN HVEM AND ITS APPLI-CATIONS TO THE STUDY OF PROPERTIES OF METALLIC MATERIALS[J]. Acta Metall Sin, 1981, 17(3): 307-351.

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摘要: <正> 一、前言目前,电子显微镜作为研究材料性能的一个有力手段,正在开辟它独立的应用领域。这是因为电镜是能对原子排列、晶体微观结构、各种晶体缺陷进行观察的唯一手段。并且,还因为它能分析出包含缺陷的微区成分;有时,也能分析其状态。但是为了得到这样高分辨率的图象,使用目前100kV(或200kV)商品电镜时,允许观察

Abstract：Ⅰ. IntroductionⅡ. Advantages of HVEM2.1 Enhancement of resolution for thicker specimen2.2 Improvement of penetrating power2.3 Broadening the scope of thicker specimen observation2.4 Improvement of visibility and contrast of crystal defects and dislocation image2.5 Accuracy of selected area diffraction2.6 Irradiation damge, bombardment damage in metals and ionization damage in organic substances2.7 Critical voltage effects2.8 Special imaging techniques to improve contrastr in HVEM2.9 High voltage scanning transmission electron microscope2.10 In-situ observation of dynamic processⅢ.Specimen, its treatment and observation conditions 3.1 Specimen3.2 Orientation control of specimen3.3 Condition of specimen treatingⅣ. Identification of crystal defects and their fundamental properties4.1 Point defects and their migration4.2 Dislocation4.3 Dislocation loop4.4 Stacking fault4.5 Small angle grain boundary and coincidence grain boundary4.6 precipitates and inclusionⅤ.Relationship between microdtructure and macro-properties5.1 Mechanical properties5.2 Recovery and recrystallization5.3 Phase transformation, nucleation and growth of precipitates5.4 Magnetic domain, structure of domain wall and its temperature dependence5.5 Property of semiconducting grains and crystal defects5.6 Electron irradiation damage5.7 Application of critical voltage effect to the study of material properties5.8 Illustration of in-situ observation Concluding remarks

收稿日期: 1981-03-18

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