金属学报  1980, Vol. 16 Issue (3): 362-383

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钨中的电迁移现象

武蕴忠

中国科学院上海冶金研究所

ELECTROMIGRATION PHENOMENON IN TUNGSTEN

Wu Yunzhong Shanghai Institute of Metallurgy; Academia Sinica

武蕴忠. 钨中的电迁移现象[J]. 金属学报, 1980, 16(3): 362-383.
. ELECTROMIGRATION PHENOMENON IN TUNGSTEN[J]. Acta Metall Sin, 1980, 16(3): 362-383.

摘要 参考文献 相关文章 Metrics 全文: PDF(1287 KB)   摘要: <正> 我所自制的Auger电子能谱仪的一次电子激发源是直热式电子枪发射的电子束。电子枪的热阴极是直径0.12mm,长15mm的发叉式钨丝,两端焊在1mm的Covar丝插座上。加热电流是直流2.0—2.5A。用光学高温计测量发叉尖端温度最高。仪器调试中发现灯丝使用寿命较短。图1(见图版45)是灯丝烧断后的形貌,断口出现在偏离发尖约0.7mm的一侧,另一侧有钨的堆积。断口和钨堆积区偏离发尖的距离不相等。图2 Abstract：Hairpin tungsten filaments showed premature failure in conducting directcurrent. The cause of this failure was interpreted as the superposition of theelectromigration and the Soret effect. An effective method has been proposed toimprove the life-time of the filament. 收稿日期: 1980-03-18      服务 把本文推荐给朋友 加入引用管理器 E-mail Alert RSS 作者相关文章 武蕴忠 44.8K 链接本文: https://www.ams.org.cn/CN/      或      https://www.ams.org.cn/CN/Y1980/V16/I3/362 [1] Huntington, H. B. and Grone, A. R., J. Phys. Chem. Solids, 20 (1961) , 76． [2] Soret, C, Arch. de Geneve, 3 (1878) , 48． [3] Shockley, W., Phys. Rev., 91 (1953) , 1563． [4] Ho, S. C., Hehenkamp, Th. and Huntington, H. B., J. Phys. Chem. Solids, 26 (1965) , 251． [5] Brinkman, J. A., Phys. Rev., 93 (1954) , 345． [6] Grone, A. R., J. Phys. Chem. Solids, 20 (1961) , 88． [7] Ho, P. S. and Huntington, H. B., J. Phys. Chem. Solids, 27 (1966) , 1319． [8] Muller, E. W., Science, 149 (1965) , 591． [9] Blech, I. A. and Meieran, E. S., Appl. Phys. Lett., 11 (1967) , 263． No related articles found! Viewed Full text Abstract Cited   Shared      Discussed