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THE APPLICATION OF ENERGY-FILTERED IMAGING TO MATERIALS RESEARCH |
YU Yingda; PING Dehai; PENG Hongring; LI Douxing; YE Heneaiang(Laboratory of Alomic Imaging of Solids; Institute of Metal Research; Chinese Academy of Sciences;Shenyang 110015) |
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Cite this article:
YU Yingda; PING Dehai; PENG Hongring; LI Douxing; YE Heneaiang(Laboratory of Alomic Imaging of Solids; Institute of Metal Research; Chinese Academy of Sciences;Shenyang 110015). THE APPLICATION OF ENERGY-FILTERED IMAGING TO MATERIALS RESEARCH. Acta Metall Sin, 1997, 33(3): 233-240.
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Abstract Elemental mapping with a high spatial resolution is indispensable to characterization of the nanoscale microstructure in the research of materials science. In the present paper, Gatan Model 678 Imaging Filter, which has been attached to HF-2000 FEG TEM, has been employed to study the microstructures at namometer scale in several materials.
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Received: 18 March 1997
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1 Wang Z L, Shapiro A L. Ultramicroscopy, 1995, 60:115 2 Gubbens A J, Krivanek O L. Ultramicroscopy,1993, 51. 146 3 Kimoto K, Hirono T, Usami K. J Electron Microsc, 1995, 44: 86 4 Hofer F, Warbichler P, Grogger W. Ultramitroscopy, 1995, 59; 15 5 Gubbens A J, Kraus B, Krivanek O L, Mooney P E. Ultramicroscopy, 1995, 59:255 6 Berger A, Mayer J, Kohl H. Ultramicroscopy, 1994, 55:101 7 Egerton R F. Electron Enerey-Loss Spectroscopy in the Electron Microscope. New York : Plenum,1986 |
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