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Acta Metall Sin  2005, Vol. 41 Issue (3): 235-241     DOI:
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The analysis of periodic layer formation during solid state reactions
CHEN Yongchong; QI Lu; ZHANG Yonggang; CHEN Changqi
College of Chemistry & Molecular Engineering; Peking University; Beijing 100871
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CHEN Yongchong; QI Lu; ZHANG Yonggang; CHEN Changqi. The analysis of periodic layer formation during solid state reactions. Acta Metall Sin, 2005, 41(3): 235-241 .

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Abstract  As one of the most interesting diffusion phenomena discovered by Osinski et al. in 1982, the periodic layer formation during solid state reactions is still far from a satisfactory description. Since the successive layers have facing surfaces with mated topography, it is considered that the seperating of the layer from the reaction front should relate to the diffusion-induced stresses developing within the separating of the layer during solid state reactions. We discovered that the layer is fractal with clusters of phase β(FeSi in diffusion couple Zn/Fe3Si or CoSi in diffusion couple Zn/Co2Si, e.g.) distributing continuously in phase α (FeZn13 or CoZn13, respectively). This empirical fact supports the mechanical-instability model for the pattern formation of periodic-layered structures.
Key words:  solid state reaction      diffusion-induced stress      periodic-layered structure      
Received:  29 April 2004     
ZTFLH:  TG111.6  

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https://www.ams.org.cn/EN/     OR     https://www.ams.org.cn/EN/Y2005/V41/I3/235

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