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| EFFECTS OF Ta SEED LAYER ON THE MICROSTRUCTURE AND MAGNETIC PROPERTY OF Ni65Co35 FILMS |
| WANG Lijin; ZHANG Hui; TENG Jiao; ZHU Fengwu |
| 北京科技大学材料科学与工程学院材料物理与化学系; 北京 100083 |
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Cite this article:
WANG Lijin; ZHANG Hui; TENG Jiao; ZHU Fengwu. EFFECTS OF Ta SEED LAYER ON THE MICROSTRUCTURE AND MAGNETIC PROPERTY OF Ni65Co35 FILMS. Acta Metall Sin, 2006, 42(9): 979-982 .
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Abstract Ta(x nm)/Ni65Co35 (40 nm) bilayers films (x = 0, 1, 2, 3, 4, 5 nm) have been prepared by DC magnetron sputtering. The effects of the thickness and deposition rate of Ta seed layer on anisotropic magnetoresistance(AMR) and coercivity of Ni65Co35 (40 nm) layer were investigated.XRD and magneto-test showed that a suitable thickness and higher deposition rate of Ta layer could promote the formation of Ni65Co35 layer with (111) texture, and remarkably increase the AMR value of Ni65Co35 layer and the sensitivity of magnetic sensor element.
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Received: 15 December 2005
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[1]McGuire T R,Potter R I.IEEE Trans Magn,1975;MAG11:1018
[2]Kitada M.Thin Solid Films,1985;131:21
[3]Chow L,Decker S,Pocket D.IEEE Trans Magn,1979;15:1833
[4]Kitada M,Shimizu N,Tanabe H.J Mater Sci,1990;26:835
[5]Kitada M,Shimizu N.J Magn Magn Mater,1991;98:215
[6]Kitada M.J Magn Magn Mater,1993;123:18
[7]Lee W Y,Toney M F,Mauri D.IEEE Trans Magn,2000;36:381
[8]Kitada M,Yamamoto K.J Magn Magn Mater,1995;147:213
[9]Gong H,Litvinov D,Klemmer T J.IEEE Trans Magn,2000;36:2963
[10]Jung H S,Doyle W D,Wittig J E.Appl Phys Lett,2002;81:2415
[11]Hyung J L.J Appl Phys,1985;57:4037
[12]Li T,Gareth T.J Appl Phys,1993;74:5025
[13]Li T,Dong L,Gareth T.J Appl Phys,1995;77:47
[14]Kitada M,Yamamoto K.J Magn Magn Mater,1995;147:213
[15]Lee L L,David E L,David N L.J Appl Phys,1996;79:4902
[16]Feng J,Romankiw L,Thompson D.IEEE Trans Magn,1977;13:1466 |
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