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Microstructures and Fatigue Damage of Submicron Thick Copper Films |
ZHANG Bin; SUN Kaihong; LIU Yongdong;ZHANG Guangping |
School of Materials & Metallurgy ; Northeastern University; Shenyang 110004 |
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Cite this article:
ZHANG Bin; SUN Kaihong; LIU Yongdong; ZHANG Guangping. Microstructures and Fatigue Damage of Submicron Thick Copper Films. Acta Metall Sin, 2006, 42(1): 1-5 .
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