COMPUTER SIMULATION ON TEXTURE EVOLUTION OF POLYCRYSTALLINE THIN FILMS DURING GRAIN GROWTH

Acta Metall Sin

1998, Vol. 34

Issue (3): 313-318 DOI:

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COMPUTER SIMULATION ON TEXTURE EVOLUTION OF POLYCRYSTALLINE THIN FILMS DURING GRAIN GROWTH

WANG Yandong; LIU Yandong; XU Jiachen; LIANG Zhide(Department of Materials Science and Engineering; Northeastern University;Shenyang 110006)

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WANG Yandong; LIU Yandong; XU Jiachen; LIANG Zhide(Department of Materials Science and Engineering; Northeastern University;Shenyang 110006). COMPUTER SIMULATION ON TEXTURE EVOLUTION OF POLYCRYSTALLINE THIN FILMS DURING GRAIN GROWTH. Acta Metall Sin, 1998, 34(3): 313-318.

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Abstract The concept of texture configuration entropy is introduced into the computer simulation on texture evolution of polycrystalline films. The grain orientation distribution in thin films is quantitatively determined by a new simple model. As an example, inverse pole figures of polycrystalline aluminum thin films are simulated by considering the change of texture configuration entropy and another orientation dependent driving forces during grain growth, such as surface energy and strain energy. The physical mechanisms affecting the texture evolution of polycrystalline thin films are discussed.

Key words: polycrystalline thin film texture evolution configuxation entropy

Received: 18 March 1998

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