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DEPENDENCE OF YIELD STRESS ON GRAIN SIZE OF NANOCRYSTALS |
ZHU Wenhui; ZHOU Guangquan; CHENG Jingyi(University Scicnce Technology; Hefei 230026)(National University Defence Technology; Changsha 410073) |
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Cite this article:
ZHU Wenhui; ZHOU Guangquan; CHENG Jingyi(University Scicnce Technology; Hefei 230026)(National University Defence Technology; Changsha 410073). DEPENDENCE OF YIELD STRESS ON GRAIN SIZE OF NANOCRYSTALS. Acta Metall Sin, 1996, 32(9): 959-965.
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Abstract A mesoscopic discription on the yield stress of nanocrystals was proposed by regarding the nanocrystals as a composite of crystalline matrix and inclusion of intercrystalline layers. By introducing effective yield stress and effective modulus, a range of critical size, over which the deviation of yield stress from Hall-Petch prediction will occur, was estimated for several typical nanocrystals, and the range depended sensitively on the properties of intercrystalline interfaces. Comparison between the obtained results and the experimental data could explain the size effect on yield stress quite well in the given range of nanocystalline size. The dependence of yield stress on grain size could be divided into four regions-linear, nonlinear, abnormal deviation and indefinite region. A method was suggested to determine the elastic modulus of inclusions starting from the mesoscopic analysis.
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Received: 18 September 1996
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