QUANTITATIVE TEXTURE ANALYSIS FOR LOW SYMMETRY POLYCRYSTALLINE MATERIALS WITH OVERLAPPING DIFFRACTION PEAKS

Acta Metall Sin

1995, Vol. 31

Issue (24): 550-554 DOI:

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QUANTITATIVE TEXTURE ANALYSIS FOR LOW SYMMETRY POLYCRYSTALLINE MATERIALS WITH OVERLAPPING DIFFRACTION PEAKS

WANG Yandong; XU Jiazhen(Northeastern University; Shenyang 110006)

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WANG Yandong; XU Jiazhen(Northeastern University; Shenyang 110006). QUANTITATIVE TEXTURE ANALYSIS FOR LOW SYMMETRY POLYCRYSTALLINE MATERIALS WITH OVERLAPPING DIFFRACTION PEAKS. Acta Metall Sin, 1995, 31(24): 550-554.

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Abstract A new algorithm of quantitative texture analysis(QTA), i. e. modified maximum entropy method(MMEM), is proposed and applied to the determination of textures in polycrystalline samples of lower crystal symmery with overlapping diffraction peaks. By introducing directly maximum entropy principle into the least square equations of pole figure inversion, the least square errors between measured and recalculated pole figures, and the optimum of maximum texture entropy may be simultaneously satisfied. Thus, the maximum entropy principle is applied to the entire processes of QTA in frame of harmonic method(HV). The simulated results of ideal fiber texture show that the precise texture vector for the materials with smooth or sharp textures will be obtained by the MMEM from the less number of pole figures.

Key words: texture analysis low symmetry crystal overlapping diffraction maximum entropy principle

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