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| "SINGLE GRAIN" OSCILLATING CRYSTAL METHOD FOR ULTRAMICROANALYSIS BY X-RAY(Ⅱ) |
| WU Qixing(Research Institute of Daye Steet Works)(Manuscript received 7 March; 1983; revised manuscript 30 June; 1983) |
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Cite this article:
WU Qixing(Research Institute of Daye Steet Works)(Manuscript received 7 March; 1983; revised manuscript 30 June; 1983). "SINGLE GRAIN" OSCILLATING CRYSTAL METHOD FOR ULTRAMICROANALYSIS BY X-RAY(Ⅱ). Acta Metall Sin, 1984, 20(1): 94-104.
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Abstract Three methods for the use of "single grain" oscillating crystal identification when the spots on the film were lacking or "residue" have been suggested, It makes the identification for superfine grains more exact and more accurate by finding out the matrix equation about the orientations in space and indices of crystallographic planes; by measuring the angles between the planes that can be represented by the spots on the film; and by taking down the number of the spots which belong to the same d value, in order to find out whether the "single grain" consists of a few crystals or of a multiphase substance. Attempts have also been made to revealing the presence of α-SiO_2 by these methods as well as to further verifying the proposed formulae and figures.
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Received: 18 January 1984
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1 吴奇星;覃道湘,金属学报,15(1979) ,274．
2 褚幼义;赵琳等编,钢中稀土夹杂物鉴定,冶金工业出版社,即将出版.
3 许顺生;金属X射线学,上海科技出版社,1962年,p.227,233．
4 Klug, H.P.; Alexander, L.E., X-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials, 2nd ed., Wiley, New York, 1974, p. 163． |
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