A NEW METHOD FOR DETERMINATION OF DIFFRACTION LINE POSITION
ZHANG Lixin; LI Liguang (Institute of Metal Research; Academia Sinica; Shenyang)(Manuscript received 29 December; 1982; revised manuscript 25 April; 1983)
Cite this article:
ZHANG Lixin; LI Liguang (Institute of Metal Research; Academia Sinica; Shenyang)(Manuscript received 29 December; 1982; revised manuscript 25 April; 1983). A NEW METHOD FOR DETERMINATION OF DIFFRACTION LINE POSITION. Acta Metall Sin, 1984, 20(1): 105-110.
Abstract A new method for the determination of the diffraction line position was developed without relation to the diffraction profile. The precision in determination may approach to △θ±0.01°. It seems to be applicable to the precise determination of the lattice constants under the condition of broadening diffraction profile symmetrically.
