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| DOUBLE-SPECIMEN METHOD FOR J_(IC) TSETING |
| by Wei Wenguang; Wang Guangsheng; Zhang Zhonglin and Lu Dingchang(Changcheng Steel Works) |
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Cite this article:
by Wei Wenguang; Wang Guangsheng; Zhang Zhonglin and Lu Dingchang(Changcheng Steel Works). DOUBLE-SPECIMEN METHOD FOR J_(IC) TSETING. Acta Metall Sin, 1981, 17(4): 478-483.
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Abstract Based upon the linear relationship between Δα and Δ_p of cracked specimen in the stable growth stage and after yielding of the toughness band, a new method using double-specimen for J_(IC) testing was developed by essential estimation of medium or high toughness materials. Its simplicity and accuracy may be available to the industrial laboratories on the requirement of engineering design.
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Received: 18 April 1981
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[1] 陈篪等,金属断裂研究文集,冶金工业出版社,1978,p.93．
[2] 日本机械学会論文集,№ 358,通常总会講演会,第42期,1976． |
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