TEM精确测定无理择优界面取向

doi:10.3724/SP.J.1037.2009.00577

金属学报

2010, Vol. 46

Issue (4): 411-417 DOI: 10.3724/SP.J.1037.2009.00577

论文

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TEM精确测定无理择优界面取向

孟杨^1;2;谷林²;张文征¹

1. 清华大学材料科学与工程系先进材料实验室; 北京 100084
2. Max Planck Institute for Metals Research; Stuttgart D--70569

PRECISE DETERMINATION OF THE IRRATIONAL PREFERRED INTERFACE ORIENTATION BY TEM

MENG Yang ^1;2; GU Lin ²; ZHANG Wenzheng ¹

1. Laboratory of Advanced Materials; Department of Materials Science and Engineering; Tsinghua University; Beijing 100084
2. Max Planck Institute for Metals Research; Stuttgart D–70569

引用本文:

孟杨谷林张文征. TEM精确测定无理择优界面取向[J]. 金属学报, 2010, 46(4): 411-417.
, , . PRECISE DETERMINATION OF THE IRRATIONAL PREFERRED INTERFACE ORIENTATION BY TEM[J]. Acta Metall Sin, 2010, 46(4): 411-417.

全文: PDF(3664 KB)

摘要:

本文介绍了一种应用透射电镜(TEM)的电子衍射菊池花样来精确测量无理择优界面取向的方法. 根据误差分析的结果, 该方法从提高测量精度和增大界面矢量间夹角两方面出发, 分别测量界面迹线和直立(edge-on)取向,计算无理择优界面的取向. 相对其它方法, 该方法将测量误差的影响降到最小, 其计算结果分布集中, 收敛性最好.

关键词 ：界面取向, 界面迹线, 菊池花样, 直立取向

Abstract：

This paper presents a method for precise determination of the orientation of the irrational preferred interface by using TEM. The interface trace and the edge–on orientations are measured careflly and separately to minimize systematic error of thrsults. Tis method was developed according to the error analysis and the fact that te accuracy of the measurement is higher when the measurement is made directly on an interface trace tan on its project on an edge–on orientation, and whn the angle between the trace and the beam direction along the an edge–on orientation is larger. Compard with xisting methods, the present method has minimized the measurement errors and its resuts show better convergence.

Key words： interface orientation interface trace Kikuchpaern edge–on orientation

收稿日期: 2009-09-04

基金资助:

国家自然科学基金项目50671051和高等学校博士学科点专项科

作者简介: 孟杨, 女, 1982年生, 博士生

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链接本文:

https://www.ams.org.cn/CN/10.3724/SP.J.1037.2009.00577 或 https://www.ams.org.cn/CN/Y2010/V46/I4/411

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