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用薄膜内耗仪测定薄膜应力 |
李健 M.Wuttig |
上海宝山钢铁股份公司分析技术中心;上海201900 |
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引用本文:
李健; M.Wuttig . 用薄膜内耗仪测定薄膜应力[J]. 金属学报, 2003, 39(11): 1225-1227 .
[1] Wuttig M, Craciunescu C, Li J. Mater Trans JIM, 2000;41: 933 [2] Mathews S, Li J, Su Q M, Wuttig M. Philos Mag, 1999;79: 265 [3] Li Q. Met Fund Mater, 1999; 6(1) : 12(李青.金属功能材料, 1999;6(1) :12) [4] Gong F F, Shen H M, Wang Y N, Jiang E Y. Acta Metall Sin, 1998; 34: 119(宫峰飞,沈惠敏,王业宁,姜恩永.金属学报,1998;34:119) [5] Kim T. PhD Thesis, University of Maryland, College Park, Maryland, USA, 1994: 18| |
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