金属学报  1987, Vol. 23 Issue (4): 389-392

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线型精炼方法中两种函数的比较

张志焜;崔相旭;王煜明

吉林大学;吉林大学;吉林大学

COMPARISON OF TWO FUNCTIONS FOR X-RAY DIFFRACTION FITTING

by ZHANG Zhikun;CUI Xiangxu; WANG Yuming (Jilin University; changchun) (Manuscript received 11 May; 1985; revised manuscript 28 April; 1986)

张志焜;崔相旭;王煜明. 线型精炼方法中两种函数的比较[J]. 金属学报, 1987, 23(4): 389-392.
, , . COMPARISON OF TWO FUNCTIONS FOR X-RAY DIFFRACTION FITTING[J]. Acta Metall Sin, 1987, 23(4): 389-392.

摘要 参考文献 相关文章 Metrics 全文: PDF(288 KB)   摘要: <正>~~ Abstract：X-ray diffraction fitting of the profiles for P-implanted monocrystalline Si was performed by means of Pearson Ⅶ and Pseudo-Voigt functions.It was found that the exactitude of the latter is better than the former.However, the former can be used to calculate the parameters easily.The correlation between 2ω/β and Pearson Ⅶ parameters m and a was presented and applied to phase analysis of SiO_2-SnO_2 mixture. 收稿日期: 1987-04-18      服务 把本文推荐给朋友 加入引用管理器 E-mail Alert RSS 作者相关文章 张志焜 崔相旭 王煜明 44.8K 链接本文: https://www.ams.org.cn/CN/      或      https://www.ams.org.cn/CN/Y1987/V23/I4/389 1 Keijser Th H De, Mittemeijer E J, Rozendaal H C F. J Appl Crystallogr, 1983; 16: 309-316 2 Keijser Th H De, Langford J I, Mittemeijer E J, Vogels A B P. J Appl Crystallogr 1982; 15:308-314 3 Alexander L, Klug H P. Anal Chem, 1948 20:886-889 4 Naidu S V N, Houska C R. J Appl Crystallogr, 1980; 15:190-19 No related articles found! Viewed Full text Abstract Cited   Shared      Discussed