金属学报  1984, Vol. 20 Issue (4): 362-369

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微区成分的X射线能谱无标样定量分析简化模型

高巧君;葛森林;张人佶;赵黎捷;宋连合;解光亮;王玉中

北京大学物理系;北京大学物理系;北京大学物理系;北京大学物理系;北京大学物理系;北京大学物理系;北京大学物理系

A SIMPLIFIED MODEL FOR NO-STANDARD MICROREGION QUANTITATIVE EDS ANALYSIS OF MULTICOMPONENT ALLOYS

GAO Qiaojun; GE Senlin; ZHANG Renji; ZHAO Lijie; SONG Lianhe; XIE Guangliang; WANG Yuzhong (Department of Physics;Peking University) (Manuscript received 11 November; 1983)

高巧君;葛森林;张人佶;赵黎捷;宋连合;解光亮;王玉中. 微区成分的X射线能谱无标样定量分析简化模型[J]. 金属学报, 1984, 20(4): 362-369.
, , , , , , . A SIMPLIFIED MODEL FOR NO-STANDARD MICROREGION QUANTITATIVE EDS ANALYSIS OF MULTICOMPONENT ALLOYS[J]. Acta Metall Sin, 1984, 20(4): 362-369.

摘要 参考文献 相关文章 Metrics 全文: PDF(521 KB)   摘要: 本文对作者建立的微区成分无标样定量分析法进行了简化,使原有的计算量大为减少。 用简化模型对Cu-Si,FeS_2,NaCl,GaAs试样和多元钢样原实验数据进行了定量计算,并与原模型多元程序计算结果进行比较。结果表明,这种简化是合理的。 Abstract：A simplified model for the method of no-standard microregion quantitative EDS analysis developed by the authors is described. The composition of specimens of Cu-Si, FeS, NaCl and GaAs as well as the multicomponent steels were calculated by this simplified model. The results obtained are in close agreement with that of previous model. It seems to be confirmed that this simplified model is available. 收稿日期: 1984-04-18      服务 把本文推荐给朋友 加入引用管理器 E-mail Alert RSS 作者相关文章 高巧君 葛森林 张人佶 赵黎捷 宋连合 解光亮 王玉中 44.8K 链接本文: https://www.ams.org.cn/CN/      或      https://www.ams.org.cn/CN/Y1984/V20/I4/362 1 吴自勤;高巧君;葛森林,物理学报,29(1980) ,485． 2 张人佶;葛森林;吴自勤,物理学报,30(1981) ,208． 3 张人佶;吴自勤,物理学报,31(1982) ,1395． 4 Reed, S. J. B., Electron Microprobe Analysis, Cambridge Univ. Press, 1975． 5#12 6 Castaing, R., Advances in Electronics and Electron Physis, Ed. Marton, L., Vol.13, Academic Press, New York, 1960, p.317． 7 Webster, D. L.; Clark. H.; Hansen, W.W., Phys. Rev., 37 (1931) , 115． 8 蔡伟;葛森林;吴自勤,物理学报,30(1981) ,895． No related articles found! Viewed Full text Abstract Cited   Shared      Discussed