金属学报  1983, Vol. 19 Issue (6): 104-110

论文 本期目录 | 过刊浏览 |

电子通道显微术观察多晶位向衬度

蓝芬兰;廖乾初;王洪君;王云

冶金工业部钢铁研究总院;冶金工业部钢铁研究总院;冶金工业部钢铁研究总院;冶金工业部钢铁研究总院

OBSERVATION OF CRYSTALLOGRAPHIC CONTRAST ON POLYCRYSTALLINE SPECIMENS BY MEANS OF CHANNELLING MICROGRAPHY TECHNIQUE

LAN Fenlan; LIAO Qianchu; WANG Hongjun; WANG Yun (Central Iron and Steel Research Institute; Ministry of Metallurgical Industry; Beijing)

蓝芬兰;廖乾初;王洪君;王云. 电子通道显微术观察多晶位向衬度[J]. 金属学报, 1983, 19(6): 104-110.
, , , . OBSERVATION OF CRYSTALLOGRAPHIC CONTRAST ON POLYCRYSTALLINE SPECIMENS BY MEANS OF CHANNELLING MICROGRAPHY TECHNIQUE[J]. Acta Metall Sin, 1983, 19(6): 104-110.

摘要 参考文献 相关文章 Metrics 全文: PDF(1254 KB)   摘要: 为了从多晶试样的表面显示多晶试样的结晶学衬度,文中对两种电子光学光路进行了探讨。分析结果表明: 1.对标准扫描光路,电子通道显微像的放大倍数是由电子束的扫描角范围控制,而几何衬度和结晶学衬度的比例可通过讯号处理方法来调节; 2.对欠聚焦摇摆光路,电子通道显微像的放大倍数由失焦距离控制,而从变形试样所获得的异常位向衬度效应有可能通过重叠在电子通道显微像上的电子通道花样来注释。 文中用W,Mo和奥氏体不锈钢等试样进行了观察,本方法有可能用来研究多晶材料的位向分布和形变行为。 Abstract：In order to reveal the crystallographic contrast from the surface of the polycrystalline specimen, two electron optical paths were analyzed. For the standard scanning path, the magnification of the channelling micrograph is controlled by the electron beam scanning angular field. The ratio between geometric and crystallographic contrast can be modulated by the signal processing method. For the defocused beam rocking path, the magnification is controlled by the defocused distance. The anomalous effects of the orientation contrast resulted by the deformed specimen may be interpreted by means of ECP superimposed on the channelling photograph.Observations were made of certain specimens such as W, Mo and 304 austenitic stainless steel. It seems that the present technique is available for study of both the orientation distribution and the deformation behaviour of the polycrystalline materials. 收稿日期: 1983-06-18      服务 把本文推荐给朋友 加入引用管理器 E-mail Alert RSS 作者相关文章 蓝芬兰 廖乾初 王洪君 王云 44.8K 链接本文: https://www.ams.org.cn/CN/      或      https://www.ams.org.cn/CN/Y1983/V19/I6/104 1 Booker, G. R., Scanning Electron Microscopy, 1971, Proc. of 4th Annual SEM Symposium, Eds. Johari, O.; Corrin, Ⅰ., ⅡT Res. Inst., Chicago, Illinois, USA, 1971, p. 467． 2 Stickler, R.; Hughes, C. W., ibid., p. 473． 3 Joy, D. C.; Newbury, D. E.; Hazzledine, P. M., Scanning Electron Microscopy, 1972, Proc. of 5th Annual SEM Symposium, Eds. Johari, O.; Corrin, Ⅰ., ⅡT Res. Inst., Chicago, Illionis, USA, 1972, p. 97． 4 Hirsch, P. B.; Humphreys, C. J., Scanning Electron Microscopy, 1969, Proc. of 2nd Annual SEM Symposium, Eds. Johari, O; Corrin, Ⅰ., ⅡT Res. Inst., Chicago, Illinois. USA, 1969, p. 451． 5 蓝芬兰,廖乾初,金属学报,16 (1980) ,104． No related articles found! Viewed Full text Abstract Cited   Shared      Discussed