金属学报  1982, Vol. 18 Issue (6): 703-712

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单晶体LAUE照相和电子衍射谱的分析方法

潘金生

清华大学

AN APPROACH TO THE ANALYSIS OF X-RAY AND ELECTRON DIFFRACTION PATTERNS OF SINGLE CRYSTALS

Pan Jinsheng (Qinghua University; Beijing)

潘金生. 单晶体LAUE照相和电子衍射谱的分析方法[J]. 金属学报, 1982, 18(6): 703-712.
. AN APPROACH TO THE ANALYSIS OF X-RAY AND ELECTRON DIFFRACTION PATTERNS OF SINGLE CRYSTALS[J]. Acta Metall Sin, 1982, 18(6): 703-712.

摘要 参考文献 相关文章 Metrics 全文: PDF(760 KB)   摘要: 本文提出了一种分析单晶体Laue照相和电子衍射谱的新方法,即旋转倒易坐标系法。它是在心射投影的基础上利用电子计算机旋转倒易坐标系,以标定衍射斑点和确定单晶取向。基于这个原理编排了计算机程序(采用BASIC语言),并用来进行了以下四方面工作:(1)标注了若干立方、六方、正方、菱方和斜方等晶体的Laue照片,同时求出晶体取向、滑移面或孪生面指数,以及切割给定取向的晶体所需的转角等。(2)标注了若干未知晶体的Laue照片。进而确定了未知晶体(X射线晶体化学分析)。(3)标定了若干立方、六方和斜方晶体的电子衍射谱,鉴定了若干未知晶体,并求得了孪晶和基体的取向关系。(4)利用计算机自动绘制了若干极射和心射标准投影,模拟绘制了各类晶体的Laue照片和电子衍射谱,同时还作出了冷轧铝板的{111}极图。旋转倒易坐标系法的主要优点是普遍、可靠、迅速、准确和高度自动化。在此基础上有可能发展为能同时记录和分析衍射谱、自动鉴别晶体和自动切割晶体的全自动晶体分析方法,以取代目前的Laue照相法。 Abstract：A new approach to the analysis of both X-ray and electron diffraction patterns of single crystals is presented. It consists in the rotation of the reciprocal axes of the crystal by computer.Based on this principle, a computer program, written in BASIC, is compiled for all crystal systems and has been used successfully for the indexing of both X-ray and electron diffraction patterns and the determination of crystal orientations. In addition, the same program with little modifications has been also used to plot the standard projections and simulate the Laue and electron diffraction patterns automatically. 收稿日期: 1982-06-18      服务 把本文推荐给朋友 加入引用管理器 E-mail Alert RSS 作者相关文章 潘金生 44.8K 链接本文: https://www.ams.org.cn/CN/      或      https://www.ams.org.cn/CN/Y1982/V18/I6/703 1 Goehner, R. P., Advances in X-Ray Analysis, Vol. 19, Ed. Gould, R. W., Kendall/Hunt, Dubuque, Lowa, 1976, p. 725． 2 Huang, W. H.; Christensen, J. H.; Block, R. J., Metall. Trans., 2(1971) , 1367． 3 Christensen, J. H.; Huang, W. H.; Block, R. J., Metall. Trans., 2(1971) , 2295． 4 Anazia, C.; Lee, C.; Jerner, R. C. Christensen, J. H.; Peavey, J. H., Metall. Trans., 6A(1975) , 1751． 5 Ploc, R. A., J. Appl. Crystallogr., 11(1978) , 713． 6 潘金生,清华大学学报,19(1979) ,20, 7 Cullity, B. D., Elements of X-Ray Diffraction, Second Edition, Addison-Wesley, Reading, Mass., 1978, p. 340． 8 Amoros, B. D.; Buerger, M. J.; Amoros, M. C. De, The Laue Method, Academic Press, New York, 1975, p. 9 潘金生,待发表工作. 10 马莒生,金属学报,18(1982) ,64．| No related articles found! Viewed Full text Abstract Cited   Shared      Discussed