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| A DATA HANDLING AND CORRECTING PROGRAM FOR QUANTITATIVE ELECTRON MICROPROBE ANALYSIS |
| Wang Wenhao;Guan Ruonan Institute of Metal Research; Academia Sinica |
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Cite this article:
Wang Wenhao;Guan Ruonan Institute of Metal Research; Academia Sinica. A DATA HANDLING AND CORRECTING PROGRAM FOR QUANTITATIVE ELECTRON MICROPROBE ANALYSIS. Acta Metall Sin, 1980, 16(2): 207-217.
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Abstract A data handling and correcting program adaptable to a minicomputer(16k mem-ory) for use in quantitative lectron icroprobe analysis was written in FOR-TRAN. The program is applicable to all elements in the atomic number range from5(B) o 92(U) and has the capability to deal with 12 elements and 30 measuringpoints each time. The data handling sub-program llows the time and number ofmeasurements for each analysing point to be varied at will and gives the averageintensity atios K as the output. The correcting sub-program allows the correctionof atomic number, absorption and fluorescence ffects and can handle various el-ements at different accelerating voltages. All physical constants, except atomicweights hich are stored in the memory, are calculated in the program, so thatonly few input data are needed.
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Received: 18 February 1980
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[1] Beaman, D. and Asasi, J., Electron Beam Microanalysis, Amer. Soc. Test. Mater., Spec. Tech. Publ. № 506, 1972, p. 71．
[2] Duncumb, P. ibid., p. 63．
[3] Colby, J., Advances in X-Ray Analysis, vol. 11, Plenum Press, New York, 1968, p. 287．
[4] #12
[5] Reed, S., Electron Microprobe Analysis, Cambridge University Press, 1975, p. 270．
[6] Kelly, T. K., Trans. Inst. Mining Met., 75 (1966) , № 711, B59．
[7] Beaman, D., Analy. Chem., 42 (1970) , 1540． |
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