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Acta Metall Sin  1982, Vol. 18 Issue (4): 493-500    DOI:
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CALCULATION OF STRESS MEASUREMENT BY X-RAY OSCILLATION METHOD
Wang Renzhi (Institute of Aeronautical Materials; Beijing) (Manuscript received 19 January; 1981; revised manuscript 23 May; 1981)
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Wang Renzhi (Institute of Aeronautical Materials; Beijing) (Manuscript received 19 January; 1981; revised manuscript 23 May; 1981). CALCULATION OF STRESS MEASUREMENT BY X-RAY OSCILLATION METHOD. Acta Metall Sin, 1982, 18(4): 493-500.

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Abstract  For the purpose of the residual stress determination of the materials with coarser grains such as most of Al alloys and Ni-base alloys using X-ray oscillation method, the formulae for the stress calculation have been proposed. It was resulted that the calculated values obtained are fairly consistent with those by conventional X-ray stress measuring methob of fixed ψ_0 angle.
Received:  18 April 1982     
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