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| A NEW METHOD FOR DETERMINATION OF DIFFRACTION LINE POSITION |
| ZHANG Lixin; LI Liguang (Institute of Metal Research; Academia Sinica; Shenyang)(Manuscript received 29 December; 1982; revised manuscript 25 April; 1983) |
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Cite this article:
ZHANG Lixin; LI Liguang (Institute of Metal Research; Academia Sinica; Shenyang)(Manuscript received 29 December; 1982; revised manuscript 25 April; 1983). A NEW METHOD FOR DETERMINATION OF DIFFRACTION LINE POSITION. Acta Metall Sin, 1984, 20(1): 105-110.
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Abstract A new method for the determination of the diffraction line position was developed without relation to the diffraction profile. The precision in determination may approach to △θ±0.01°. It seems to be applicable to the precise determination of the lattice constants under the condition of broadening diffraction profile symmetrically.
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Received: 18 January 1984
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1 Klug, H.P.; Alexander, L.E., X-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials, 2nd ed., Wiley, New York, 1974, p. 566．
2 Cheary R.W., J. Appl. Cryst., 15 (1982) , 5． |
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