COMPARISON OF METHODS ON EVALUATION AND MEASUREMENT OF NANO-PARTICLES SIZE

Acta Metall Sin

1993, Vol. 29

Issue (1): 49-58 DOI:

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COMPARISON OF METHODS ON EVALUATION AND MEASUREMENT OF NANO-PARTICLES SIZE

ZHU Jing;LIN Xiwei;GUO Wei;JIA Liping;ZHAO Xiangrong;ZHANG Jinyuan;LIU Chunlan;YE Hengqiang;NING Xiaoguang Central Iorn and Steel Research Institute; Ministry of Metallurgical Industry; Beijing Laboratory of Atomic Imaging of Solid; Institute of Metal Research; Academia Sinica; Shengyang

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Abstract Method of TEM compositive anlysis-dispersion for measuring nano-particlesize is reviewed. Comparison of methods between this and of X-ray small angle scattering aswell as of TEM in dark field was carried out by experiments and anlyses. It is believed thatcombination of X-ray small angle scattering and TEM compositive analysis-dispersionmethod is the more rapid, accurate and comprehensive way to evaluate and measure thenano-particle size.

Key words: nano-particle particle size X-ray small angle scattering TEM compositive analysis-dispersion method dark field method

Received: 18 January 1993

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